Low-Power Operation for Video Event Data Recorder

Author(s):  
Jinyoung Yang ◽  
Jongpil Jung ◽  
Chong-Min Kyung
2018 ◽  
Vol 33 (4) ◽  
pp. 325-333 ◽  
Author(s):  
Blangat Dileep ◽  
Ravi Mana ◽  
Karunakara Nerugundi ◽  
Sangameshwar Managanvi ◽  
Raj Tripathi

In pressurized heavy water reactors, leaks from D2O primary coolant and moderator to H2O secondary coolant and other light-water systems in heat exchangers cannot be completely ruled out. High cost of D2O demands that its loss should be prevented to maximum extent possible. Traditionally D2O leak detection and identification of leaky heat exchanger is carried out by measurement of tritium activity in H2O. Since tritium emits low energy beta radiation, its concentration in H2O is measured by mixing it with liquid scintillation solution in a definite proportion in counting vial and counted in a Liquid Scintillation Analyzer. It is very sensitive method for leak detection, but identification of leaky heat exchanger is time consuming and may require low power operation or reactor shut down. In the new method, high energy beta emitting fission products, which emit Cherenkov photons in H2O, were used as the tracer. H2O was poured in 20 mL plastic vials without scintillator and counted on Liquid Scintillation Analyzer. D2O leak was identified by comparing the Cherenkov photon count rate with that of the blank. A discrimination ratio significantly higher than average Cherenkov photon count rate for all heat exchangers was used to identify the leaky one. The technique has advantageous over existing method of D2O leak detection, such as, (1) scintillation chemicals are not required (2) low power operation or reactor shut down is not required for identifying the leaky heat exchanger (3) no generation of radioactive chemical waste (4) on-power leak identification reduces generation of radioactive liquid waste.


2017 ◽  
Vol 64 (12) ◽  
pp. 1362-1366 ◽  
Author(s):  
Robert Giterman ◽  
Adam Teman ◽  
Pascal Meinerzhagen
Keyword(s):  

Author(s):  
Ronald G. Dreslinski ◽  
David Fick ◽  
David Blaauw ◽  
Dennis Sylvester ◽  
Trevor Mudge
Keyword(s):  

2013 ◽  
pp. 633-639 ◽  
Author(s):  
Jean-Michel Peyneau ◽  
Laurent Fiot ◽  
Stéphane Mermet-Guyenet ◽  
Olivier Rebouillat
Keyword(s):  

Author(s):  
B. Shivalal Patro ◽  
Vandana B.

Semiconductor industries are facing a lot of problems in designing the chips consist of transistors with less than 10nm technology. Moore's law which predicted the scaling down of semiconductor devices has forced the researchers to look upon the devices in another aspect. So, various architectures and materials are invented to increase the reliability, speed and most importantly low power operation without increasing the size of devices. The on-set of nanotechnology and nano-science leads to unconventional 3D structure devices to and 0-dimensional structures. This chapter gives a general overview of the various technologies; materials and architectures researchers are concentrating to continue the technology beyond Moore's law with low power consumption.


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