Test Signal Generation for Detecting Faults on Mil-Std 1553 Bus

Author(s):  
Sowmya Madhavan ◽  
S. Sandya
2003 ◽  
Vol 1 ◽  
pp. 235-238
Author(s):  
B. Burdiek ◽  
W. Mathis

Abstract. In this paper a new test signal generation approach for general analog circuits based on the variational calculus and modern control theory methods is presented. The computed transient test signals also called test stimuli are optimal with respect to the detection of a given fault set by means of a predefined merit functional representing a fault detection criterion. The test signal generation problem of finding optimal test stimuli detecting all faults form the fault set is formulated as an optimal control problem. The solution of the optimal control problem representing the test stimuli is computed using an optimization procedure. The optimization procedure is based on the necessary conditions for optimality like the maximum principle of Pontryagin and adjoint circuit equations.


Author(s):  
Michael Ungermann ◽  
Jan Lunze ◽  
Dieter Schwarzmann

Test signal generation for service diagnosis based on local structural propertiesThe paper presents a new approach to the generation of test signals used in service diagnosis. The tests make it possible to isolate faults, which are isolable only if the system is brought into specific operating points. The basis for the test signal selection is a structure graph that represents the couplings among the external and internal signals of the system and the fault signals. Graph-theoretic methods are used to identify edges that disappear under certain operating conditions and prevent a fault from changing the system behavior at this operating point. These operating conditions are identified by validuals, which are indicators obtained during the graph-theoretic analysis. The test generation method is illustrated by a process engineering example.


2010 ◽  
Vol 43 (7) ◽  
pp. 117-122 ◽  
Author(s):  
Michael Ungermann ◽  
Jan Lunze ◽  
Dieter Scharzmann

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