Automatic test signal generation for mixed-signal integrated circuits using circuit partitioning and interval analysis

2016 IEEE International Test Conference (ITC) ◽

10.1109/test.2016.7805867 ◽

2016 ◽

Author(s):

Anthony Coyette ◽

Baris Esen ◽

Wim Dobbelaere ◽

Ronny Vanhooren ◽

Georges Gielen

Keyword(s):

Integrated Circuits ◽

Interval Analysis ◽

Test Signal ◽

Signal Generation ◽

Circuit Partitioning ◽

Automatic Test ◽

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Analog signal generation for built-in self-test of mixed-signal integrated circuits

Microelectronics Journal ◽

10.1016/s0026-2692(96)90016-6 ◽

1996 ◽

Vol 27 (1) ◽

pp. 103-104

Author(s):

S.L. Hurst

Keyword(s):

Integrated Circuits ◽

Analog Signal ◽

Signal Generation ◽

Mixed Signal ◽

Self Test ◽

Built In Self Test

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Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits

10.1007/978-1-4615-2341-3 ◽

1995 ◽

Author(s):

Gordon W. Roberts ◽

Albert K. Lu

Keyword(s):

Integrated Circuits ◽

Analog Signal ◽

Signal Generation ◽

Mixed Signal ◽

Self Test ◽

Built In Self Test

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Automatic test plan generation for analog and mixed signal integrated circuits using partial activation and high level simulation

Proceedings of IEEE International Test Conference - (ITC) ◽

10.1109/test.1993.470708 ◽

2002 ◽

Author(s):

N. Ravindranath ◽

G.N. Nandakumar ◽

K. Srinivasa Rao

Keyword(s):

Integrated Circuits ◽

Test Plan ◽

Automatic Test ◽

Mixed Signal ◽

Plan Generation ◽

Partial Activation ◽

Test Plan Generation

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ATPRG: an automatic test program generator using HDL-A for fault diagnosis of analog/mixed-signal integrated circuits

IEEE Transactions on Instrumentation and Measurement ◽

10.1109/19.744186 ◽

1998 ◽

Vol 47 (2) ◽

pp. 426-431 ◽

Author(s):

Wei-Hsing Huang ◽

Chin-Long Wey

Keyword(s):

Fault Diagnosis ◽

Integrated Circuits ◽

Automatic Test ◽

Test Program ◽

Mixed Signal ◽

Program Generator

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Simulation Of an Integrated Design and Test Environment For Mixed Signal Integrated Circuits

Proceedings International Test Conference 1992 ◽

10.1109/test.1992.527850 ◽

2005 ◽

Author(s):

S.C. Bateman ◽

W.H. Kao

Keyword(s):

Integrated Circuits ◽

Integrated Design ◽

Test Environment ◽

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Analog/Mixed-Signal Integrated Circuits for Quantum Computing

2020 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS) ◽

10.1109/bcicts48439.2020.9392973 ◽

2020 ◽

Author(s):

Joseph C Bardin

Keyword(s):

Quantum Computing ◽

Integrated Circuits ◽

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Vertical Noise Reduction in 3D Mixed-Signal Integrated Circuits with Graphene Nanoribbon and Carbon Nanotube Interconnects

IEEE Transactions on Components Packaging and Manufacturing Technology ◽

10.1109/tcpmt.2020.3045877 ◽

2020 ◽

pp. 1-1

Author(s):

Soheila Gharavi Hamedani ◽

Mohammad Hossein Moaiyeri ◽

Masoud Meghdadi ◽

Maryam Rezaei Khezeli

Keyword(s):

Carbon Nanotube ◽

Integrated Circuits ◽

Noise Reduction ◽

Graphene Nanoribbon ◽

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A hierarchical analog test bus framework for testing mixed-signal integrated circuits and printed circuit boards

Analog Integrated Circuits and Signal Processing ◽

10.1007/bf01239078 ◽

1993 ◽

Vol 4 (3) ◽

pp. 261-268 ◽

Author(s):

Nai-Chi Lee

Keyword(s):

Integrated Circuits ◽

Printed Circuit Boards ◽

Circuit Boards ◽

Analog Test ◽

Mixed Signal ◽

Printed Circuit

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Sequential Test Signal Generation for Parameter Estimation in Continuous-time Systems

IFAC Proceedings Volumes ◽

10.1016/s1474-6670(17)54844-2 ◽

1988 ◽

Vol 21 (9) ◽

pp. 903-911

Author(s):

M.B. Zarroo ◽

Zhao Zhi-fan

Keyword(s):

Parameter Estimation ◽

Continuous Time ◽

Test Signal ◽

Sequential Test ◽

Signal Generation ◽

Continuous Time Systems ◽

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Simulation and Modeling for Analog and Mixed-Signal Integrated Circuits

Electronic Design Automation for IC Implementation, Circuit Design, and Process Technology ◽

10.1201/9781315215112-30 ◽

2017 ◽

pp. 477-500

Keyword(s):

Integrated Circuits ◽

Simulation And Modeling ◽

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