Consensus for Heterogeneous Networked Systems Based on Second-Order Neighbors’ Information

2020 ◽  
pp. 508-517
Author(s):  
Lei Wang ◽  
Huanyu Zhao ◽  
Dongsheng Du ◽  
Hongbiao Zhou
Keyword(s):  
Second Order ◽  
Networked Systems

Distributed fault detection and isolation in second order networked systems in a cyber–physical environment

2020 ◽  
Vol 103 ◽  
pp. 131-142 ◽  
Author(s):  
Aadil Sarwar Khan ◽  
Abdul Qayyum Khan ◽  
Naeem Iqbal ◽  
Muhammad Sarwar ◽  
Atif Mahmood ◽  
...  
Keyword(s):  
Fault Detection ◽  
Physical Environment ◽  
Second Order ◽  
Networked Systems ◽  
Fault Detection And Isolation ◽  
Distributed Fault Detection

scholarly journals Topological and Graph-Coloring Conditions on the Parameter-Independent Stability of Second-Order Networked Systems

2017 ◽  
Vol 55 (6) ◽  
pp. 3750-3778 ◽  
Author(s):  
Filip J. Koerts ◽  
Mathias Bürger ◽  
Arjan J. van der Schaft ◽  
Claudio De Persis
Keyword(s):  
Graph Coloring ◽  
Second Order ◽  
Networked Systems

A Geometric Approach to Second-Order Consensus of Heterogeneous Networked Systems

2019 ◽  
pp. 1-10
Author(s):  
Housheng Su ◽  
Yanyan Ye ◽  
Xia Chen ◽  
Haibo He
Keyword(s):  
Geometric Approach ◽  
Second Order ◽  
Networked Systems

Disappearance Voltage Determinations Using a Convergent Beam

1971 ◽  
Vol 29 ◽  
pp. 184-185
Author(s):  
W. L. Bell
Keyword(s):  
Second Order ◽  
Objective Method ◽  
Uniform Thickness ◽  
Rocking Curve ◽  
Crystal Perfection ◽  
Kikuchi Line ◽  
Central Maximum ◽  
Diffraction Patterns ◽  
Convergent Beam ◽  
Beam Technique

Disappearance voltages for second order reflections can be determined experimentally in a variety of ways. The more subjective methods, such as Kikuchi line disappearance and bend contour imaging, involve comparing a series of diffraction patterns or micrographs taken at intervals throughout the disappearance range and selecting that voltage which gives the strongest disappearance effect. The estimated accuracies of these methods are both to within 10 kV, or about 2-4%, of the true disappearance voltage, which is quite sufficient for using these voltages in further calculations. However, it is the necessity of determining this information by comparisons of exposed plates rather than while operating the microscope that detracts from the immediate usefulness of these methods if there is reason to perform experiments at an unknown disappearance voltage.The convergent beam technique for determining the disappearance voltage has been found to be a highly objective method when it is applicable, i.e. when reasonable crystal perfection exists and an area of uniform thickness can be found. The criterion for determining this voltage is that the central maximum disappear from the rocking curve for the second order spot.

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