The rapid development of machine vision has prompted the continuous emergence of new detection systems and algorithms in surface defect detection. However, most of the existing methods establish their systems with few comparisons and verifications, and the methods described still have various problems. Thus, an original defect detection method: Segmented Embedded Rapid Defect Detection Method for Surface Defects (SERDD) is proposed in this paper. This method realizes the two-way fusion of image processing and defect detection, which can efficiently and accurately detect surface defects such as depression, scratches, notches, oil, shallow characters, abnormal dimensions, etc. Besides, the character recognition method based on Spatial Pyramid Character Proportion Matching (SPCPM) is used to identify the engraved characters on the bearing dust cover. Moreover, the problem of characters being cut in coordinate transformation is solved through Image Self-Stitching-and-Cropping (ISSC). This paper adopts adequate real image data to verify and compare the methods and proves the effectiveness and advancement through detection accuracy, missing alarm rate, and false alarm rate. This method can provide machine vision technical support for bearing surface defect detection in its real sense.
Integrated color defect detection method for polysilicon wafers using machine vision
