Based on the non-ideal planar defect model developed by the authors earlier and electron scattering flux pinning mechanism, we have derived a temperature dependence of critical current which predicts a same relation for both of I c and H c2 in dirty type-II superconductors. In order to test the prediction, the I c (T) and H c2 (T) were measured on PbBi-SiO multilayer films. The agreement between the theoretical and experimental results is satisfactory.