Quantitative characterization of AlAs/GaAs interfaces by high-resolution transmission electron microscopy along the ?100? and the ?110? projection
1993 ◽
Vol 57
(5)
◽
pp. 393-400
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2000 ◽
Vol 39
(Part 1, No. 3A)
◽
pp. 1278-1285
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2015 ◽
Vol 95
(3)
◽
pp. 145-151
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