Exact solutions for the discrete Boltzmann models with specular reflection

1988 ◽  
Vol 16 (3) ◽  
pp. 245-250 ◽  
Author(s):  
Henri Cornille
Keyword(s):  
Exact Solutions ◽  
Specular Reflection ◽  
Discrete Boltzmann Models

Forensic applications of IR infrared microscopic internal reflection spectroscopy

1992 ◽  
Vol 50 (2) ◽  
pp. 1528-1529
Author(s):  
Edward G. Bartick ◽  
John A. Reffner
Keyword(s):  
Specular Reflection ◽  
Forensic Analysis ◽  
Attenuated Total Reflection ◽  
Internal Reflection ◽  
Standard Size ◽  
Ir Microscopy ◽  
Ir Analysis ◽  
Plastic Explosives ◽  
Internal Reflection Spectroscopy ◽  
Reflectance Measurements

Since the introduction of commercial Fourier transform infrared (FTIR) microscopic systems in 1983, IR microscopy has developed as an important analytical tool in research, industry and forensic analysis. Because of the frequent encounter of small quantities of physical evidence found at crime scenes, spectroscopic IR microscopes have proven particularly valuable for forensic applications. Transmittance and reflectance measurements have proven very useful. Reflection-absorption, specular reflection, and diffuse reflection have all been applied. However, it has been only very recently that an internal reflection (IRS) objective has been commercially introduced.The IRS method, also known as attenuated total reflection (ATR), has proven very useful for IR analysis of standard size samples. The method has been applied to adhesive tapes, plastic explosives, and general applications in the analysis of opaque materials found as evidence. The small quantities or uncontaminated areas of specimens frequently found requiring forensic analysis will often be directly applicable to microscopic IRS analysis.

Valence electron energy loss spectroscopy in reflection geometry

1989 ◽  
Vol 47 ◽  
pp. 378-379
Author(s):  
J. Liu ◽  
J. M. Cowley
Keyword(s):  
Energy Loss ◽  
Valence Electron ◽  
Interband Transition ◽  
Specular Reflection ◽  
Three Dimensional ◽  
Electron Excitation ◽  
Transmission Electron ◽  
Yield Information ◽  
Valence Bands ◽  
Excitation Processes

The low energy loss region of a EELS spectrum carries information about the valence electron excitation processes (e.g., collective excitations for free electron like materials and interband transitions for insulators). The relative intensities and the positions of the interband transition energy loss peaks observed in EELS spectra are determined by the joint density of states (DOS) of the initial and final states of the excitation processes. Thus it is expected that EELS in reflection mode could yield information about the perturbation of the DOS of the conduction and valence bands of the bulk crystals caused by the termination of the three dimensional periodicity at the crystal surfaces. The experiments were performed in a Philipps 400T transmission electron microscope operated at 120 kV. The reflection EELS spectra were obtained by a Gatan 607 EELS spectrometer together with a Tracor data acquisition system and the resolution of the spectrometer was about 0.8 eV. All the reflection spectra are obtained from the specular reflection spots satisfying surface resonance conditions.

Extended F-Expansion Method for Solving the modified Korteweg-de Vries (mKdV) Equation

2020 ◽  
Vol 11 (1) ◽  
pp. 93-100
Author(s):  
Vina Apriliani ◽  
Ikhsan Maulidi ◽  
Budi Azhari
Keyword(s):  
Wave Equation ◽  
Exact Solutions ◽  
Internal Waves ◽  
Water Waves ◽  
Wave Equations ◽  
Elliptic Functions ◽  
Expansion Method ◽  
Mkdv Equation ◽  
Innovative Methods ◽  
De Vries

One of the phenomenon in marine science that is often encountered is the phenomenon of water waves. Waves that occur below the surface of seawater are called internal waves. One of the mathematical models that can represent solitary internal waves is the modified Korteweg-de Vries (mKdV) equation. Many methods can be used to construct the solution of the mKdV wave equation, one of which is the extended F-expansion method. The purpose of this study is to determine the solution of the mKdV wave equation using the extended F-expansion method. The result of solving the mKdV wave equation is the exact solutions. The exact solutions of the mKdV wave equation are expressed in the Jacobi elliptic functions, trigonometric functions, and hyperbolic functions. From this research, it is expected to be able to add insight and knowledge about the implementation of the innovative methods for solving wave equations. 

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