Size and temperature dependence of thermoelectric power and electrical resistivity of vacuum-deposited antimony thin films

1989 ◽  
Vol 24 (12) ◽  
pp. 4315-4323 ◽  
Author(s):  
V. Damodara Das ◽  
N. Soundararajan
1981 ◽  
Vol 16 (12) ◽  
pp. 3331-3334 ◽  
Author(s):  
V. Damodara Das ◽  
N. Jayaprakash ◽  
N. Soundararajan

2002 ◽  
Vol 734 ◽  
Author(s):  
R. Govinthasamy ◽  
J. H. Rhee ◽  
S. C Sharma

ABSTRACTHighly conducting thin films of C60 were deposited by thermal evaporation in high vacuum on single crystal silicon substrates. The microstructure of the films was characterized by using Atomic Force Microscopy, and laser Raman spectroscopy. The films were polymerized by uv irradiation. The dc electrical resistivities of the as-deposited and uv-polymerized films were measured as functions of temperature between 295 and 17K by the four-probe technique. We present results on the effects of uv-irradiation on the surface microstructure and the temperature dependence of the electrical resistivity of these films.


2006 ◽  
Vol 973 ◽  
Author(s):  
Takayuki Matsumoto ◽  
Shigeo Yamaguchi ◽  
Atsushi Yamamoto

ABSTRACTWe have studied the temperature dependence of thermoelectric properties of amorphous InN thin films prepared by reactive radio-frequency sputtering. We fabricated 60-pair and 120-pair InN-chromel films, which were deposited on polyimide films. For the 120-pair device, the maximum open output voltage and the maximum output power were 210 mV and 65 nW, respectively, at temperature difference of 168 K.


Vacuum ◽  
1995 ◽  
Vol 46 (11) ◽  
pp. 1299-1303 ◽  
Author(s):  
F Abd El-Salam ◽  
AM Ibraheim ◽  
AH Ammar ◽  
AY Morsy

1987 ◽  
Vol 104 (2) ◽  
pp. 793-797 ◽  
Author(s):  
A. I. Eatah ◽  
A. A. Ghani ◽  
M. F. El-Shahat ◽  
E. El-Faramawy

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