Monochromatic intensity measurements of selected areas of lunar surface for possible investigations

Joseph Sidky Mikhail

doi:10.1007/bf01877800

The Geosciences Applied to Lunar Exploration

Symposium - International Astronomical Union ◽

10.1017/s0074180900178222 ◽

1962 ◽

Vol 14 ◽

pp. 169-257 ◽

Cited By ~ 9

Author(s):

J. Green

Keyword(s):

Lunar Surface ◽

Probable Mechanism ◽

Point Of View ◽

Lunar Exploration ◽

Geological Model ◽

Apply Geophysics ◽

Surface Features ◽

The Impact

The term geo-sciences has been used here to include the disciplines geology, geophysics and geochemistry. However, in order to apply geophysics and geochemistry effectively one must begin with a geological model. Therefore, the science of geology should be used as the basis for lunar exploration. From an astronomical point of view, a lunar terrain heavily impacted with meteors appears the more reasonable; although from a geological standpoint, volcanism seems the more probable mechanism. A surface liberally marked with volcanic features has been advocated by such geologists as Bülow, Dana, Suess, von Wolff, Shaler, Spurr, and Kuno. In this paper, both the impact and volcanic hypotheses are considered in the application of the geo-sciences to manned lunar exploration. However, more emphasis is placed on the volcanic, or more correctly the defluidization, hypothesis to account for lunar surface features.

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A Photographic Map of the Moon

Symposium - International Astronomical Union ◽

10.1017/s0074180900178179 ◽

1962 ◽

Vol 14 ◽

pp. 113-115

Author(s):

D. W. G. Arthur ◽

E. A. Whitaker

Keyword(s):

Lunar Surface ◽

The Moon ◽

Map Projection

The cartography of the lunar surface can be split into two operations which can be carried on quite independently. The first, which is also the most laborious, is the interpretation of the lunar photographs into the symbolism of the map, with the addition of fine details from telescopic sketches. An example of this kind of work is contained in Johann Krieger'sMond Atlaswhich consists of photographic enlargements in which Krieger has sharpened up the detail to accord with his telescopic impressions. Krieger did not go on either to convert the photographic picture into the line symbolism of a map, or to place this picture on any definite map projection.

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Thickness and composition determinations from T.E.M. specimens using both x-ray and backscattered electron data

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100112816 ◽

1984 ◽

Vol 42 ◽

pp. 576-577

Author(s):

M.D. Ball ◽

H. Lagace ◽

M.C. Thornton

Keyword(s):

Electron Microscope ◽

Atomic Number ◽

Transmission Electron Microscope ◽

Convenient Method ◽

Flow Chart ◽

X Ray ◽

Intensity Measurements ◽

Transmission Electron ◽

Electron Intensity ◽

Backscattered Electron

The backscattered electron coefficient η for transmission electron microscope specimens depends on both the atomic number Z and the thickness t. Hence for specimens of known atomic number, the thickness can be determined from backscattered electron coefficient measurements. This work describes a simple and convenient method of estimating the thickness and the corrected composition of areas of uncertain atomic number by combining x-ray microanalysis and backscattered electron intensity measurements.The method is best described in terms of the flow chart shown In Figure 1. Having selected a feature of interest, x-ray microanalysis data is recorded and used to estimate the composition. At this stage thickness corrections for absorption and fluorescence are not performed.

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