Improved setup for studying the low-frequency noise in semiconductor devices and structures
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2001 ◽
Vol 40
(Part 1, No. 12)
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pp. 6770-6777
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2006 ◽
Vol 362
(2)
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pp. 277-288
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Low frequency noise measurements as a tool to analyze deep-level impurities in semiconductor devices
1987 ◽
Vol 30
(3)
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pp. 259-265
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