IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest.
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296

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High performance 30 nm gate bulk CMOS for 45 nm node with σ-shaped SiGe-SD

IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. ◽

10.1109/iedm.2005.1609316 ◽

2006 ◽

Author(s):

H. Ohta ◽

Y. Kim ◽

Y. Shimamune ◽

T. Sakuma ◽

A. Hatada ◽

...

Keyword(s):

High Performance

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Detectors, sensors, and MEMS - MEMS technologies and applications

IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. ◽

10.1109/iedm.2005.1609326 ◽

2006 ◽

Author(s):

D. Young ◽

J. Brugger

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Technology for sub-50nm DRAM and NAND flash manufacturing

IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. ◽

10.1109/iedm.2005.1609340 ◽

2006 ◽

Author(s):

Kinam Kim

Keyword(s):

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Analysis and implications of ic cooling for deep nanometer scale cmos technologies

IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. ◽

10.1109/iedm.2005.1609537 ◽

2006 ◽

Author(s):

Sheng-Chih Lin ◽

R. Mahajan ◽

Vivek De ◽

K. Banerjee

Keyword(s):

Nanometer Scale ◽

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RFCPUs on glass and plastic substrates fabricated by TFT transfer technology

IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. ◽

10.1109/iedm.2005.1609284 ◽

2006 ◽

Author(s):

H. Dembo ◽

Y. Kurokawa ◽

T. Ikeda ◽

S. Iwata ◽

K. Ohshima ◽

...

Keyword(s):

Plastic Substrates

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Non-uniform degradation behavior across device width in RF power GaAs PHEMTs

IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. ◽

10.1109/iedm.2005.1609471 ◽

2006 ◽

Author(s):

A.A. Villanueva ◽

J.A. del Alamo ◽

T. Hisaka ◽

K. Hayashi ◽

M. Somerville

Keyword(s):

Degradation Behavior ◽

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Evidence of traps creation in GaN/AlGaN/GaN HEMTs after a 3000 hour on-state and off-state hot-electron stress

IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. ◽

10.1109/iedm.2005.1609416 ◽

2006 ◽

Author(s):

A. Sozza ◽

C. Dua ◽

E. Morvan ◽

M.A. diForte-Poisson ◽

S. Delage ◽

...

Keyword(s):

Hot Electron ◽

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Influence of terrestrial cosmic rays on the reliability of CCD image sensors

IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. ◽

10.1109/iedm.2005.1609479 ◽

2006 ◽

Author(s):

A.J.P. Theuwissen

Keyword(s):

Cosmic Rays ◽

Image Sensors ◽

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Emerging technologies flexible electronics

IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. ◽

10.1109/iedm.2005.1609372 ◽

2006 ◽

Author(s):

V. Misra

Keyword(s):

Flexible Electronics ◽

Emerging Technologies

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High density and high speed SRAM bit-cells and ring oscillators due to laser annealing for 45nm bulk CMOS

IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. ◽

10.1109/iedm.2005.1609438 ◽

2006 ◽

Author(s):

A. Pouydebasque ◽

B. Dumont ◽

S. Denorme ◽

F. Wacquant ◽

M. Bidaud ◽

...

Keyword(s):

Laser Annealing ◽

High Density ◽

Ring Oscillators

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