On the application of charged particle activation analysis to the trace characterization of semiconductor materials
1974 ◽
Vol 19
(1)
◽
pp. 89-108
◽
1985 ◽
Vol 91
(2)
◽
pp. 369-378
◽
1992 ◽
Vol 68
(1-4)
◽
pp. 161-165
◽
1990 ◽
Vol 26-27
(1)
◽
pp. 119-131
◽
1988 ◽
Vol 125
(1)
◽
pp. 143-150
◽
1999 ◽
Vol 431
(1-2)
◽
pp. 366-377