Feasibility Study on the Characterization of Thin Layers by Charged-Particle Activation Analysis

2000 ◽  
Vol 72 (13) ◽  
pp. 2814-2820 ◽  
Author(s):  
K. De Neve ◽  
K. Strijckmans ◽  
R. Dams
Keyword(s):  
Charged Particle ◽  
Activation Analysis ◽  
Feasibility Study ◽  
Thin Layers ◽  
Charged Particle Activation Analysis ◽  
Charged Particle Activation ◽  
Particle Activation

Charged Particle Activation Analysis of Carbon on Silicon Plates and Its Use for the Monitoring of Organic Contamination of the Air

1999 ◽  
Vol 71 (16) ◽  
pp. 3551-3557 ◽  
Author(s):  
Tadashi Nozaki ◽  
Hirochika Yagi ◽  
Hisashi Muraoka ◽  
Akira Nagano ◽  
Masakazu Kohno
Keyword(s):  
Charged Particle ◽  
Activation Analysis ◽  
Organic Contamination ◽  
Charged Particle Activation Analysis ◽  
Charged Particle Activation ◽  
Particle Activation
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