Impact of electromagnetic interference on the functional safety of smart power devices for automotive applications

Bernd Deutschmann; Gunter Winkler; Paul Kastner

doi:10.1007/s00502-018-0633-4

Impact of electromagnetic interference on the functional safety of smart power devices for automotive applications

e & i Elektrotechnik und Informationstechnik ◽

10.1007/s00502-018-0633-4 ◽

2018 ◽

Vol 135 (4-5) ◽

pp. 352-359 ◽

Cited By ~ 4

Author(s):

Bernd Deutschmann ◽

Gunter Winkler ◽

Paul Kastner

Keyword(s):

Electromagnetic Interference ◽

Functional Safety ◽

Automotive Applications ◽

Power Devices ◽

Smart Power

Download Full-text

Fault state behavior of smart power devices during electromagnetic interference

2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC/APEMC) ◽

10.1109/isemc.2018.8394033 ◽

2018 ◽

Author(s):

Bernd Deutschmann ◽

Paul Kastner ◽

Gunter Winkler

Keyword(s):

Electromagnetic Interference ◽

Power Devices ◽

Smart Power ◽

State Behavior ◽

Fault State

Download Full-text

New on-chip screening of gate oxides smart power devices for automotive applications

2009 IEEE International Reliability Physics Symposium ◽

10.1109/irps.2009.5173313 ◽

2009 ◽

Cited By ~ 3

Author(s):

Vezio Malandruccolo ◽

Mauro Ciappa ◽

Hubert Rothleitner ◽

Wolfgang Fichtner

Keyword(s):

Automotive Applications ◽

Power Devices ◽

Smart Power ◽

Gate Oxides ◽

On Chip

Download Full-text

Functional safety standard's techniques and measures in light of electromagnetic interference

2017 XXVI International Scientific Conference Electronics (ET) ◽

10.1109/et.2017.8124403 ◽

2017 ◽

Author(s):

Jonas Van Waes ◽

Jens Vankeirsbilck ◽

Davy Pissoort ◽

Jeroen Boydens

Keyword(s):

Electromagnetic Interference ◽

Functional Safety

Download Full-text

Smart Power Devices and ICs Using GaAs and Wide and Extreme Bandgap Semiconductors

IEEE Transactions on Electron Devices ◽

10.1109/ted.2017.2653759 ◽

2017 ◽

Vol 64 (3) ◽

pp. 856-873 ◽

Cited By ~ 54

Author(s):

T. Paul Chow ◽

Ichiro Omura ◽

Masataka Higashiwaki ◽

Hiroshi Kawarada ◽

Vipindas Pala

Keyword(s):

Power Devices ◽

Smart Power ◽

Bandgap Semiconductors

Download Full-text

High Complexity Smart Power Devices and Future Developments

Smart Power ICs ◽

10.1007/978-3-642-61395-1_11 ◽

2002 ◽

pp. 435-463

Author(s):

G. Pedrazzini ◽

S. Storti

Keyword(s):

High Complexity ◽

Power Devices ◽

Smart Power ◽

Future Developments

Download Full-text

Including Electromagnetic Interference (EMI) in Functional Safety Risk Assessments

Achieving Systems Safety ◽

10.1007/978-1-4471-2494-8_9 ◽

2011 ◽

pp. 97-114 ◽

Cited By ~ 2

Author(s):

Keith Armstrong

Keyword(s):

Electromagnetic Interference ◽

Risk Assessments ◽

Functional Safety ◽

Safety Risk

Download Full-text

TherMos>sup/sup<: a 3D electrothermal simulator for Smart Power Devices

2006 IEEE International Symposium on Power Semiconductor Devices & IC's ◽

10.1109/ispsd.2006.1666109 ◽

2006 ◽

Cited By ~ 1

Author(s):

A. Irace ◽

G. Breglio ◽

P. Spirito

Keyword(s):

Power Devices ◽

Smart Power

Download Full-text

An Overview of Smart Power Technologies for Automotive Applications

10.4271/871584 ◽

1987 ◽

Author(s):

Brad Marshall ◽

Raymond Dewey

Keyword(s):

Automotive Applications ◽

Smart Power

Download Full-text

Electromagnetic Interference (EMI) Measurements for Automotive Applications

10.4271/760273 ◽

1976 ◽

Author(s):

J.W. Adams ◽

M.L. Crawford ◽

J.F. Shafer

Keyword(s):

Electromagnetic Interference ◽

Automotive Applications

Download Full-text

Lifetime prediction and design of reliability tests for high-power devices in automotive applications

IEEE Transactions on Device and Materials Reliability ◽

10.1109/tdmr.2003.818148 ◽

2003 ◽

Vol 3 (4) ◽

pp. 191-196 ◽

Cited By ~ 91

Author(s):

M. Ciappa ◽

F. Carbognani ◽

W. Fichtner

Keyword(s):

High Power ◽

Lifetime Prediction ◽

Automotive Applications ◽

Power Devices

Download Full-text