A low insertion loss, multi-band, fixed central capacitor based RF-MEMS switch

2014 ◽  
Vol 21 (10) ◽  
pp. 2259-2264 ◽  
Author(s):  
Mahesh Angira ◽  
Kamaljit Rangra
2015 ◽  
Vol 83 (3) ◽  
pp. 2289-2301 ◽  
Author(s):  
Mahesh Angira ◽  
G. M. Sundaram ◽  
Kamal Jit Rangra

2013 ◽  
Vol 20 (2) ◽  
pp. 337-340 ◽  
Author(s):  
Deepak Bansal ◽  
Amit Kumar ◽  
Akshdeep Sharma ◽  
Prem Kumar ◽  
K. J. Rangra

2021 ◽  
pp. 1-1
Author(s):  
Naibo Zhang ◽  
Ruiliang Song ◽  
Jun Liu ◽  
Jun Yang

2017 ◽  
Vol 93 (1-4) ◽  
pp. 661-670 ◽  
Author(s):  
Yasser Mafinejad ◽  
Abbas Kouzani ◽  
Khalil Mafinezhad ◽  
Reza Hosseinnezhad

2020 ◽  
Vol 12 ◽  
Author(s):  
Pampa Debnath ◽  
Ujjwal Mondal ◽  
Arpan Deyasi

Aim:: Computation of loss factors for one-bit RF MEMS switch over Ku, K and Ka-band for two different insulating substrates. Objective:: Numerical investigation of return loss, insertion loss, isolation loss are computed under both actuated and unactuated states for two different insulating substrates of the 1-bit RF MEMS switch, and corresponding up and down-capacitances are obtained. Methods:: The unique characteristics of a 1-bit RF MEMS switch of providing higher return loss under both actuated and unactuated states and also of isolation loss with negligible insertion loss makes it as a prime candidate for phase shifter application. This is presented in this manuscript with a keen focus on improvement capability by changing transmission line width, and also of overlap area; where dielectric constant of the substrate also plays a vital role. Results:: The present work exhibits very low down-capacitance over the spectrum whereas considerable amount of up-capacitance. Also when overall performance in terms of all loss parameters are considered, switch provides very low insertion loss, good return loss under actuated state and standard isolation loss. Conclusion:: Reduction of transmission line width of about 33% improved the performance of the switch by increasing isolation loss. Isolation loss of -40 dB is obtained at actuated condition in higher microwave spectra for SiO 2 at higher overlap area. Down capacitance of ~ 1dB is obtained which is novel as compared with other published literature. Moreover, a better combination of both return loss, isolation loss and insertion loss are reported in this present work compared with all other published data so far.


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