scholarly journals Second-Order Estimates for the Macroscopic Response and Loss of Ellipticity in Porous Rubbers at Large Deformations

2004 ◽  
Vol 76 (3) ◽  
pp. 247-287 ◽  
Author(s):  
Oscar Lopez-Pamies ◽  
Pedro Ponte Casta�eda
Author(s):  
P. Ponte Castañeda

A variational method is developed to estimate the macroscopic constitutive response of composite materials consisting of aggregates of viscoplastic single-crystal grains and other inhomogeneities. The method derives from a stationary variational principle for the macroscopic stress potential of the viscoplastic composite in terms of the corresponding potential of a linear comparison composite (LCC), whose viscosities and eigenstrain rates are the trial fields in the variational principle. The resulting estimates for the macroscopic response are guaranteed to be exact to second order in the heterogeneity contrast, and to satisfy known bounds. In addition, unlike earlier ‘second-order’ methods, the new method allows optimization with respect to both the viscosities and eigenstrain rates, leading to estimates that are fully stationary and exhibit no duality gaps. Consequently, the macroscopic response and field statistics of the nonlinear composite can be estimated directly from the suitably optimized LCC, without the need for difficult-to-compute correction terms. The method is applied to a simple example of a porous single crystal, and the results are found to be more accurate than earlier estimates.


Author(s):  
W. L. Bell

Disappearance voltages for second order reflections can be determined experimentally in a variety of ways. The more subjective methods, such as Kikuchi line disappearance and bend contour imaging, involve comparing a series of diffraction patterns or micrographs taken at intervals throughout the disappearance range and selecting that voltage which gives the strongest disappearance effect. The estimated accuracies of these methods are both to within 10 kV, or about 2-4%, of the true disappearance voltage, which is quite sufficient for using these voltages in further calculations. However, it is the necessity of determining this information by comparisons of exposed plates rather than while operating the microscope that detracts from the immediate usefulness of these methods if there is reason to perform experiments at an unknown disappearance voltage.The convergent beam technique for determining the disappearance voltage has been found to be a highly objective method when it is applicable, i.e. when reasonable crystal perfection exists and an area of uniform thickness can be found. The criterion for determining this voltage is that the central maximum disappear from the rocking curve for the second order spot.


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