A numerical method for a transient quantum drift-diffusion model arising in semiconductor devices

2008 ◽  
Vol 7 (4) ◽  
pp. 485-493 ◽  
Author(s):  
Tomoko Shimada ◽  
Shinji Odanaka
VLSI Design ◽  
1998 ◽  
Vol 8 (1-4) ◽  
pp. 301-305 ◽  
Author(s):  
D. Vasileska ◽  
W. J. Gross ◽  
V. Kafedziski ◽  
D. K. Ferry

As semiconductor technology continues to evolve, numerical modeling of semiconductor devices becomes an indispensible tool for the prediction of device characteristics. The simple drift-diffusion model is still widely used, especially in the study of subthreshold behavior in MOSFETs. The numerical solution of these two equations offers difficulties in small devices and special methods are required for the case when dealing with 3D problems that demand large CPU times. In this work we investigate the convergence properties of the Bi-CGSTAB method. We find that this method shows superior convergence properties when compared to more commonly used ILU and SIP methods.


1994 ◽  
Vol 04 (03) ◽  
pp. 439-453 ◽  
Author(s):  
CHRISTIAN SCHMEISER

A stationary version of the standard drift-diffusion model for the flow of electrons and holes in semiconductor devices is considered. The boundary conditions are, to a certain extent, capable of describing the influence of the surrounding electrical circuit as opposed to the usual mathematical assumption of prescribed voltages. The existence of solutions and the convergence close to thermal equilibrium of a decoupled iteration method are proved.


2001 ◽  
Vol 11 (05) ◽  
pp. 827-840 ◽  
Author(s):  
WEIFU FANG ◽  
KAZUFUMI ITO

We analyze a mathematical model for semiconductors derived from the hydrodynamic model under the massless assumption. This model augments the classical drift-diffusion model by including temperature as a dependent variable. We establish the existence of stationary solutions near the equilibrium state.


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