Design of Memories with Concurrent Error Detection and Correction by Nonlinear SEC-DED Codes

2010 ◽  
Vol 26 (5) ◽  
pp. 559-580 ◽  
Author(s):  
Zhen Wang ◽  
Mark Karpovsky ◽  
Konrad J. Kulikowski
2009 ◽  
Vol 3 (1) ◽  
pp. 22-40 ◽  
Author(s):  
C.W. Chiou ◽  
C.-C. Chang ◽  
T.-W. Hou ◽  
J.-M. Lin ◽  
C.-Y. Lee

2012 ◽  
Vol 48 (20) ◽  
pp. 1258 ◽  
Author(s):  
P. Reviriego ◽  
S. Pontarelli ◽  
C.J. Bleakley ◽  
J.A. Maestro

2009 ◽  
Vol 58 (6) ◽  
pp. 851-857 ◽  
Author(s):  
Che Wun Chiou ◽  
Chin-Cheng Chang ◽  
Chiou-Yng Lee ◽  
Ting-Wei Hou ◽  
Jim-Min Lin

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