Mapping quantitative trait loci associated with spot blotch and net blotch resistance in a doubled-haploid barley population

2011 ◽  
Vol 30 (1) ◽  
pp. 267-279 ◽  
Author(s):  
Tajinder S. Grewal ◽  
Brian G. Rossnagel ◽  
Graham J. Scoles
2013 ◽  
Vol 33 (2) ◽  
pp. 249-265 ◽  
Author(s):  
Elsayed Mansour ◽  
Ana M. Casas ◽  
M. Pilar Gracia ◽  
José Luis Molina-Cano ◽  
Marian Moralejo ◽  
...  

2009 ◽  
Vol 89 (5) ◽  
pp. 837-844 ◽  
Author(s):  
L Zhao ◽  
K Zhang ◽  
B Liu ◽  
J Tian

In order to understand the genetic basis of starch pasting viscosity characteristics (the RVA profile, which is produced by the Rapid Visco Analyser) of wheat grain samples, a doubled haploid (DH) population (Huapei 3 × Yumai 57; Yumai 57 is superior to Huapei 3 for RVA profile parameters) and a linkage map consisting of 324 marker loci were used to search QTL. This program was based on mixed linear models and allowed simultaneous mapping of additive effect QTL, epistatic QTL, and QTL × environment interactions (QE). Mapping analysis produced a total of 35 QTL for 6 RVA profile parameters with a single QTL explaining 0.91-21.34% of phenotypic variations. The 35 QTL were distributed on 15 chromosomes. The QBd-4A had the most significant additive effect, accounting for 21.34% of the phenotypic variance. Two QTL clusters for RVA profile parameters were located on chromosomes 2A and 4A, respectively. The information obtained in this study should be useful for manipulating the QTL for RVA profiles parameters by molecular assisted selection (MAS) in wheat breeding programs.Key words: Doubled haploid population, paste viscosity characteristics, rapid visco analyser, quantitative trait loci, wheat (Triticum aestivum L.)


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