Inelastic electron tunneling spectroscopy (IETS) study of high-k gate dielectrics

2011 ◽  
Vol 54 (5) ◽  
pp. 980-989 ◽  
Author(s):  
T. P. Ma
2010 ◽  
Vol 22 (26-27) ◽  
pp. 2962-2968 ◽  
Author(s):  
James W. Reiner ◽  
Sharon Cui ◽  
Zuoguang Liu ◽  
Miaomiao Wang ◽  
Charles H. Ahn ◽  
...  

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