Inelastic Electron Tunneling Spectroscopy (IETS) Study of Ultra-Thin Gate Dielectrics for Advanced CMOS Technology
2011 ◽
Vol 54
(5)
◽
pp. 980-989
◽
1975 ◽
Vol 16
(5)
◽
pp. 663-665
◽
1987 ◽
pp. 135-181
◽