CuInSe2 thin films obtained by pulse-plating electrodeposition technique with novel pulse wave

2010 ◽  
Vol 55 (18) ◽  
pp. 1854-1858 ◽  
Author(s):  
XiaoLi Wang ◽  
GuangJun Wang ◽  
BaoLi Tian ◽  
ShaoMing Wan ◽  
ZuLiang Du
2013 ◽  
Author(s):  
Nirupama Singh ◽  
Pushpendra Kumar ◽  
Sumant Upadhyay ◽  
Surbhi Choudhary ◽  
Vibha R. Satsangi ◽  
...  

2018 ◽  
Vol 21 (1) ◽  
pp. 015-019
Author(s):  
P. Jeyakumar ◽  
S. Thanikaikarasan ◽  
B. Natarajan ◽  
T. Mahalingam ◽  
Luis Ixtlilco

Copper Telluride thin films have been prepared on Fluorine doped Tin Oxide coated conducting glass substrates using electrodeposition technique. Cyclic voltammetric analysis has been carried out to analyze the growth mechanism of the deposited films. Thickness value of the deposited films has been estimated using Stylus profilometry. X-ray diffraction pattern revealed that the prepared films possess polycrystalline in nature. Microstructural parameters such as crystallite size, strain and dislocation density are evaluated using observed X-ray diffraction data. Optical absorption analysis showed that the prepared films are found to exhibit band gap value around 2.03 eV.


2020 ◽  
Author(s):  
Farhad Syed

Highly textured phase pure Cu2O thin films have been grown by a simple electrodeposition technique with varying deposition voltages (-0.3 to -1.0 V). The surface morphology characterized by Scanning Electron Microscopy (SEM) revealed that the deposited thin films coherently carpet the underlying substrate and composed of sharp faceted well-define grains of 0.5 – 1.0 µm sizes. XRD analyses showed that all films are composed of polycrystalline cubic Cu2O phase only and have average crystalline domain size in the range 30 – 73 nm. The preferred crystalline orientation of phase pure Cu2O films were found to be changing from (200) to (111) with increasing cathodic voltages and showed highest (111) and (200) crystalline texture coefficient while grown at -1.0 and -0.8 V respectively. Optical bandgap of the as-grown samples were calculated in the range (1.95 – 2.20) eV using UV-Vis Transmission data. The performance of copper oxide films was tested by estimating LED 'ON/OFF' modulated surface photovoltage into a photoelectrochemical cell at a zero bias.


2020 ◽  
Vol MA2020-01 (19) ◽  
pp. 1212-1212 ◽  
Author(s):  
Syed Farid Uddin Farhad ◽  
Mohammad Moazzem Hossain ◽  
Nazmul Islam Tanvir ◽  
Suravi Islam

2019 ◽  
Vol 683 ◽  
pp. 82-89 ◽  
Author(s):  
C. Ravichandiran ◽  
A. Sakthivelu ◽  
R. Davidprabu ◽  
K. Deva Arun Kumar ◽  
S. Valanarasu ◽  
...  

Optik ◽  
2019 ◽  
Vol 193 ◽  
pp. 162996 ◽  
Author(s):  
M. Beraich ◽  
M. Taibi ◽  
A. Guenbour ◽  
A. Zarrouk ◽  
M. Boudalia ◽  
...  

2018 ◽  
Vol 75 ◽  
pp. 471-482 ◽  
Author(s):  
Hassan Kirou ◽  
Lahoucine Atourki ◽  
Khadija Abouabassi ◽  
Ali Soltani ◽  
Abdelmajid Almaggoussi ◽  
...  

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