Finite element analysis of temperature distribution of polycrystalline silicon thin film transistors under self-heating stress
2009 ◽
Vol 4
(2)
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pp. 227-233
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2007 ◽
Vol 54
(12)
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pp. 3276-3284
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2010 ◽
Vol 31
(8)
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pp. 830-832
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2020 ◽
Vol 67
(8)
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pp. 3163-3166
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2011 ◽
Vol 50
(3)
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pp. 03CB04
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