A composite model for the grain-size dependence of yield stress of nanograined materials

2003 ◽  
Vol 34 (3) ◽  
pp. 765-772 ◽  
Author(s):  
B. Jiang ◽  
G. J. Weng
Keyword(s):  
Grain Size ◽  
Yield Stress ◽  
Size Dependence ◽  
Composite Model

216 Grain-Size Dependence of Yield Stress of Aluminum in Tortioin Test

2001 ◽  
Vol 2001.39 (0) ◽  
pp. 71-72
Author(s):  
Hiroshi MIURA ◽  
Shigeru NAGAKI ◽  
Ichiro SHIMIZU ◽  
Kenji TEDUKA ◽  
Takeji ABE
Keyword(s):  
Grain Size ◽  
Yield Stress ◽  
Size Dependence

The yield stress of polycrystalline thin films

1993 ◽  
Vol 8 (2) ◽  
pp. 237-238 ◽  
Author(s):  
C.V. Thompson
Keyword(s):  
Thin Films ◽  
Grain Size ◽  
Film Thickness ◽  
Yield Stress ◽  
Size Dependence ◽  
Detailed Understanding ◽  
Polycrystalline Thin Films ◽  
Observed Behavior

In recent experiments it has been shown that the yield stress of polycrystalline thin films depends separately on the film thickness and the grain size. It was also shown that the grain size dependence varies as the reciprocal of the grain size. In this paper an analysis is presented which leads to these results and provides a more detailed understanding of the origins of the observed behavior.

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