Three-Dimensional Orientation Microscopy in a Focused Ion Beam–Scanning Electron Microscope: A New Dimension of Microstructure Characterization
2008 ◽
Vol 39
(2)
◽
pp. 374-389
◽
S. Zaefferer
◽
S.I. Wright
◽
D. Raabe
Shingo Hirashima
◽
Keisuke Ohta
◽
Tomonoshin Kanazawa
◽
Akinobu Togo
◽
Tatsuyuki Kakuma
◽
...
2019 ◽
Vol 04
(02)
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pp. 182
◽
T. Kanazawa
◽
M. Gotoh
◽
K. Ohta
◽
N. Shibai
◽
K. Nakamura
2018 ◽
Vol 55
(1)
◽
pp. 23-31
◽
Shingo Hirashima
◽
Keisuke Ohta
◽
Tomonoshin Kanazawa
◽
Satoko Okayama
◽
Akinobu Togo
◽
...
Kiyosato Hino
◽
Shingo Hirashima
◽
Risa Tsuneyoshi
◽
Akinobu Togo
◽
Tasuku Hiroshige
◽
...
2011 ◽
Vol 49
(2)
◽
pp. 541-553
◽
A. J. Anderson
◽
T. McCarron
2014 ◽
Vol 106
(2)
◽
pp. 600a
Rina Nagai
◽
Keisuke Ohta
◽
Atsuko H. Iwane
2015 ◽
Vol 34
(6)
◽
pp. 969-976
◽
Tomonoshin Kanazawa
◽
Masafumi Gotoh
◽
Keisuke Ohta
◽
Naoto Shiba
◽
Kei-ichiro Nakamura
2019 ◽
Vol 68
(Supplement_1)
◽
pp. i52-i52
Masahiro Hosonuma
◽
Nobuhiro Sakai
◽
Takashi Takaki
◽
Hideki Matsushima
◽
Akira Takebe
◽
...
2011 ◽
Vol 196
(6)
◽
pp. 3073-3082
◽
Katsuhisa Matsuzaki
◽
Naoki Shikazono
◽
Nobuhide Kasagi