scholarly journals Three-Dimensional Orientation Microscopy in a Focused Ion Beam–Scanning Electron Microscope: A New Dimension of Microstructure Characterization

2008 ◽  
Vol 39 (2) ◽  
pp. 374-389 ◽  
Author(s):  
S. Zaefferer ◽  
S.I. Wright ◽  
D. Raabe
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