Comparative Study of Optical and Electrical Properties of Grown-In and Freshly Introduced Dislocations in GaN by SEM Methods

2020 ◽  
Vol 49 (9) ◽  
pp. 5173-5177
Author(s):  
P. S. Vergeles ◽  
E. B. Yakimov ◽  
V. I. Orlov
2020 ◽  
Vol 54 (9) ◽  
pp. 999-1010
Author(s):  
H. Naeem-ur-Rehman Khan ◽  
M. Mehmood ◽  
F. C. C. Ling ◽  
A. Faheem Khan ◽  
S. M. Ali

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