Comparative Study of Optical and Electrical Properties of Grown-In and Freshly Introduced Dislocations in GaN by SEM Methods
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2017 ◽
Vol 43
(13)
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pp. 10487-10493
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2014 ◽
Vol 331
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pp. 168-171
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2018 ◽
Vol 29
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pp. 5638-5648
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2010 ◽
Vol 58
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pp. 12-17
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2018 ◽
Vol 56
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pp. 476-483
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