Optical and Structural Properties of TiO2 Thin Films Deposited by RF Magnetron Sputtering

Silicon ◽  
2018 ◽  
Vol 11 (3) ◽  
pp. 1247-1252 ◽  
Author(s):  
R. Shakoury ◽  
A. Zarei
2015 ◽  
Vol 120 (2) ◽  
pp. 765-773 ◽  
Author(s):  
M. Sreedhar ◽  
I. Neelakanta Reddy ◽  
Parthasarathi Bera ◽  
D. Ramachandran ◽  
K. Gobi Saravanan ◽  
...  

2012 ◽  
Vol 626 ◽  
pp. 168-172
Author(s):  
Samsiah Ahmad ◽  
Nor Diyana Md Sin ◽  
M.N. Berhan ◽  
Mohamad Rusop

Zinc Oxide (ZnO) thin films were deposited onto SiO2/Si substrates using radio frequency (RF) magnetron sputtering method as an Ammonia (NH3) sensor. The dependence of RF power (50~300 Watt) on the structural properties and sensitivity of NH3sensor were investigated. XRD analysis shows that regardless of the RF power, all samples display the preferred orientation on the (002) plane. The results show that the ZnO deposited at 200 Watt display the highest sensitivity value which is 44%.


2006 ◽  
Vol 6 (5) ◽  
pp. 931-933 ◽  
Author(s):  
Xiu-Tian Zhao ◽  
Kenji Sakka ◽  
Naoto Kihara ◽  
Yasuyuki Takata ◽  
Makoto Arita ◽  
...  

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