Investigation of the instability of low-temperature poly-silicon thin film transistors under a negative bias temperature stress

Yu-Mi Kim; Kwang-Seok Jeong; Ho-Jin Yun; Seung-Dong Yang; Sang-Youl Lee; Hi-Deok Lee; Ga-Won Lee

doi:10.1007/s13391-013-3173-4

Investigation of the instability of low-temperature poly-silicon thin film transistors under a negative bias temperature stress

Electronic Materials Letters ◽

10.1007/s13391-013-3173-4 ◽

2013 ◽

Vol 9 (S1) ◽

pp. 13-16 ◽

Cited By ~ 2

Author(s):

Yu-Mi Kim ◽

Kwang-Seok Jeong ◽

Ho-Jin Yun ◽

Seung-Dong Yang ◽

Sang-Youl Lee ◽

...

Keyword(s):

Thin Film ◽

Low Temperature ◽

Temperature Stress ◽

Thin Film Transistors ◽

Negative Bias ◽

Silicon Thin Film ◽

Poly Silicon ◽

Bias Temperature Stress

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Investigation of Degradation Behavior During Illuminated Negative Bias Temperature Stress in P-Channel Low-Temperature Polycrystalline Silicon Thin-Film Transistors

IEEE Electron Device Letters ◽

10.1109/led.2021.3068423 ◽

2021 ◽

Vol 42 (5) ◽

pp. 712-715

Author(s):

Yu-Xuan Wang ◽

Ting-Chang Chang ◽

Mao-Chou Tai ◽

Chia-Chuan Wu ◽

Yu-Fa Tu ◽

...

Keyword(s):

Thin Film ◽

Low Temperature ◽

Temperature Stress ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Negative Bias ◽

Degradation Behavior ◽

Silicon Thin Film ◽

Bias Temperature Stress

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High-Performance Self-Aligned Bottom-Gate Low-Temperature Poly-Silicon Thin-Film Transistors With Excimer Laser Crystallization

IEEE Electron Device Letters ◽

10.1109/led.2007.899326 ◽

2007 ◽

Vol 28 (7) ◽

pp. 599-602 ◽

Cited By ~ 24

Author(s):

Chun-Chien Tsai ◽

Hsu-Hsin Chen ◽

Bo-Ting Chen ◽

Huang-Chung Cheng

Keyword(s):

Thin Film ◽

Low Temperature ◽

Excimer Laser ◽

Thin Film Transistors ◽

High Performance ◽

Laser Crystallization ◽

Silicon Thin Film ◽

Poly Silicon ◽

Excimer Laser Crystallization ◽

Bottom Gate

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Degradation of Low Temperature Polycrystalline Silicon Thin Film Transistors under Negative Bias Temperature Instability Stress with Illumination Effect

Journal of The Electrochemical Society ◽

10.1149/1.3265456 ◽

2010 ◽

Vol 157 (2) ◽

pp. J29 ◽

Cited By ~ 4

Author(s):

Chia-Sheng Lin ◽

Ying-Chung Chen ◽

Ting-Chang Chang ◽

Hung-Wei Li ◽

Wei-Che Hsu ◽

...

Keyword(s):

Thin Film ◽

Low Temperature ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Negative Bias ◽

Negative Bias Temperature Instability ◽

Silicon Thin Film ◽

Temperature Instability ◽

Bias Temperature Instability ◽

Illumination Effect

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Instability of p-channel poly-Si thin-film transistors under dynamic negative bias temperature stress

2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits ◽

10.1109/ipfa.2010.5531996 ◽

2010 ◽

Cited By ~ 4

Author(s):

Jie Zhou ◽

Mingxiang Wang ◽

Man Wong

Keyword(s):

Thin Film ◽

Temperature Stress ◽

Thin Film Transistors ◽

Negative Bias ◽

Bias Temperature Stress ◽

Si Thin Film

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Improving Negative-Bias-Temperature-Stress Stability for Thin-Film Transistors by Doping Mg Into ScInO Semiconductor

IEEE Transactions on Electron Devices ◽

10.1109/ted.2019.2911635 ◽

2019 ◽

Vol 66 (6) ◽

pp. 2620-2623 ◽

Cited By ~ 1

Author(s):

Linfeng Lan ◽

Xingqiang Dai ◽

Changchun He ◽

Lu Liu ◽

Xiaobao Yang ◽

...

Keyword(s):

Thin Film ◽

Temperature Stress ◽

Thin Film Transistors ◽

Negative Bias ◽

Bias Temperature Stress

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Capacitance-voltage technique for characterization of lateral trap locations along the channel in low-temperature poly-silicon thin film transistors

Solid-State Electronics ◽

10.1016/j.sse.2019.107647 ◽

2020 ◽

Vol 163 ◽

pp. 107647

Author(s):

Han Bin Yoo ◽

Junyeap Kim ◽

Jintae Yu ◽

Hyo-Jin Kim ◽

Sung-Jin Choi ◽

...

Keyword(s):

Thin Film ◽

Low Temperature ◽

Thin Film Transistors ◽

Silicon Thin Film ◽

Poly Silicon ◽

Capacitance Voltage

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The time response for the low-temperature poly-silicon thin-film transistors to x-ray irradiation pulse

Semiconductor Science and Technology ◽

10.1088/1361-6641/abe316 ◽

2021 ◽

Vol 36 (4) ◽

pp. 045003

Author(s):

Ya-Hsiang Tai ◽

Shan Yeh ◽

Wei-Lin Chen ◽

Ting-Chang Chang

Keyword(s):

Thin Film ◽

Low Temperature ◽

Thin Film Transistors ◽

Time Response ◽

Silicon Thin Film ◽

X Ray ◽

Poly Silicon ◽

Irradiation Pulse

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P-173L: Late-News Poster: A 2.2-inch QVGA System-on-Glass LCD Using P-Type Low Temperature Poly-Silicon Thin Film Transistors

SID Symposium Digest of Technical Papers ◽

10.1889/1.2036444 ◽

2005 ◽

Vol 36 (1) ◽

pp. 352 ◽

Cited By ~ 5

Author(s):

Shin-Hung Yeh ◽

Wein-Town Sun ◽

Jian-Shen Yu ◽

Chien-Chih Chen ◽

Jargon Lee ◽

...

Keyword(s):

Thin Film ◽

Low Temperature ◽

Thin Film Transistors ◽

Silicon Thin Film ◽

Poly Silicon ◽

Late News ◽

P Type

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Two-Stage Degradation of p-Channel Poly-Si Thin-Film Transistors Under Dynamic Negative Bias Temperature Stress

IEEE Transactions on Electron Devices ◽

10.1109/ted.2011.2158582 ◽

2011 ◽

Vol 58 (9) ◽

pp. 3034-3041 ◽

Cited By ~ 14

Author(s):

Jie Zhou ◽

Mingxiang Wang ◽

Man Wong

Keyword(s):

Thin Film ◽

Temperature Stress ◽

Thin Film Transistors ◽

Negative Bias ◽

Two Stage ◽

Bias Temperature Stress ◽

Si Thin Film

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A Two-Stage Degradation Model of p-Channel Low-Temperature Poly-Si Thin-Film Transistors Under Positive Bias Temperature Stress

IEEE Transactions on Electron Devices ◽

10.1109/ted.2011.2160949 ◽

2011 ◽

Vol 58 (10) ◽

pp. 3501-3505 ◽

Cited By ~ 5

Author(s):

Xiaowei Lu ◽

Mingxiang Wang ◽

Man Wong

Keyword(s):

Thin Film ◽

Low Temperature ◽

Temperature Stress ◽

Thin Film Transistors ◽

Positive Bias ◽

Two Stage ◽

Degradation Model ◽

Bias Temperature Stress ◽

Si Thin Film

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