Small-Signal Analysis of Parallel Connected Voltage Source Inverters Using a Frequency and Voltage Droop Control Including an Additional Phase Shift

2014 ◽  
Vol 25 (5) ◽  
pp. 597-607 ◽  
Author(s):  
Wanderley Alves Parreira ◽  
Henrique José Avelar ◽  
João Batista Vieira ◽  
Luiz Carlos Freitas ◽  
Luiz Carlos Gomes de Freitas ◽  
...  
Keyword(s):  
Phase Shift ◽  
Signal Analysis ◽  
Voltage Source ◽  
Droop Control ◽  
Small Signal ◽  
Voltage Source Inverters ◽  
Small Signal Analysis ◽  
Additional Phase Shift ◽  
Additional Phase

Object Wave Determination by Single-Sideband Methods

1973 ◽  
Vol 31 ◽  
pp. 266-267
Author(s):  
Kenneth H. Downing ◽  
Benjamin M. Siegel
Keyword(s):  
Phase Shift ◽  
Carbon Films ◽  
Object Wave ◽  
Electron Wave ◽  
Phase Object ◽  
Heavy Atoms ◽  
Single Sideband ◽  
Thin Carbon ◽  
Additional Phase Shift ◽  
Additional Phase

Under the “weak phase object” approximation, the component of the electron wave scattered by an object is phase shifted by π/2 with respect to the unscattered component. This phase shift has been confirmed for thin carbon films by many experiments dealing with image contrast and the contrast transfer theory. There is also an additional phase shift which is a function of the atomic number of the scattering atom. This shift is negligible for light atoms such as carbon, but becomes significant for heavy atoms as used for stains for biological specimens. The light elements are imaged as phase objects, while those atoms scattering with a larger phase shift may be imaged as amplitude objects. There is a great deal of interest in determining the complete object wave, i.e., both the phase and amplitude components of the electron wave leaving the object.

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