Crystal growth morphology in high purity white phosphorus

1977 ◽  
Vol 37 (1) ◽  
pp. 64-68 ◽  
Author(s):  
J.D. Ayers ◽  
R.J. Schaefer ◽  
M.E. Glicksman
2002 ◽  
Vol 242 (1-2) ◽  
pp. 70-76 ◽  
Author(s):  
Masato Aoki ◽  
Hisanori Yamane ◽  
Masahiko Shimada ◽  
Seiji Sarayama ◽  
Francis J DiSalvo

2020 ◽  
Vol 1003 ◽  
pp. 247-253
Author(s):  
Zhi Xin Ma ◽  
Xiao Guo Bi ◽  
Xu Dong Liu ◽  
Xiao Dong Li ◽  
Ji Guang Li ◽  
...  

LYSO:Ce single crystal was widely manufactured by Czochralski method. Considering its high cost and the pollution of the crucible, we tried to prepare the crystal by Verneuil method. Unlike Czochralski method, the Verneuil method need the powders with excellent fluidity and high purity. By comparing the powders annealed at 1100°C,1200°C,1300°C,1400°C and 1500°C, we can obtained the needed powders at 1500°C. We also increased the content of silica to satisfy the volatilization in crystal growth process. The single crystal was prepared by changing the growth parameter. We investigated the phase and the microstructure of the powders and observed the microstucture of the crystal fracture. We discussed the improved method of the process of crystal growth.


2008 ◽  
Vol 43 (8) ◽  
pp. 874-881 ◽  
Author(s):  
Xinqiang Wang ◽  
Dong Xu ◽  
Guanghui Zhang ◽  
Quan Ren ◽  
Weiliang Liu

2015 ◽  
Vol 39 ◽  
pp. 54-60 ◽  
Author(s):  
Guojian Wang ◽  
Mark Amman ◽  
Hao Mei ◽  
Dongming Mei ◽  
Klaus Irmscher ◽  
...  

Author(s):  
E. Philippot ◽  
A. Goiffon ◽  
J.C. Jumas ◽  
C. Avinens ◽  
J. Detaint ◽  
...  

2001 ◽  
Vol 224 (3-4) ◽  
pp. 335-341 ◽  
Author(s):  
H Cano ◽  
N Gabas ◽  
J.P Canselier

2012 ◽  
Vol 529 ◽  
pp. 64-68
Author(s):  
H. Wang ◽  
C.F. Yan ◽  
H.K. Kong ◽  
J.J. Chen ◽  
J. Xin ◽  
...  

This work focused on the synthesis of source powder for SiC crystal growth. SiC powder was prepared using high purity silicon and carbon powder. Broad ranges of temperature and Ar pressure were studied on the property of the as-prepared powder. X-ray diffraction (XRD) results show that SiC polytypes were determined by synthesis temperature, while not related to the variation of Ar pressure. The lattice constant of SiC would expand when Ar pressure decreased. Raman results revealed that the variation of Ar pressure would influence SiC crystallization. It was found that the concentrations of free C, free Si and nitrogen all varied with the variation of temperature or Ar pressure.


Nature ◽  
1995 ◽  
Vol 374 (6520) ◽  
pp. 342-345 ◽  
Author(s):  
X. Y. Liu ◽  
E. S. Boek ◽  
W. J. Briels ◽  
P. Bennema

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