High-resolution transmission electron microscopy study on SiC grown from SiO and C*: crystal growth and structural characterization

1993 ◽  
Vol 131 (1-2) ◽  
pp. 5-12 ◽  
Author(s):  
M. Benaissa ◽  
J. Werckmann ◽  
J.L. Hutchison ◽  
E. Peschiera ◽  
J. Guille ◽  
...  
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