High-resolution transmission electron microscopy study on SiC grown from SiO and C*: crystal growth and structural characterization
1993 ◽
Vol 131
(1-2)
◽
pp. 5-12
◽
2002 ◽
Vol 82
(4)
◽
pp. 735-749
◽
2006 ◽
Vol 203
(9)
◽
pp. 2229-2235
◽
1999 ◽
Vol 79
(5)
◽
pp. 1155-1166
◽
1992 ◽
Vol 32
(1)
◽
pp. 77-85
◽
1993 ◽
Vol 68
(2)
◽
pp. 185-194
◽
1989 ◽
Vol 117
◽
pp. 199-206
◽
2012 ◽
Vol 132
(1)
◽
pp. 125-130
◽
2006 ◽
Vol 179
(6)
◽
pp. 1857-1863
◽