In situ examination of anodic silver oxide films by EXAFS in the reflection mode

1995 ◽  
Vol 381 (1-2) ◽  
pp. 113-121 ◽  
Author(s):  
D. Hecht ◽  
P. Borthen ◽  
H.-H. Strehblow
Keyword(s):  
Silver Oxide ◽  
Oxide Films ◽  
Reflection Mode ◽  
In Situ Examination

ChemInform Abstract: In situ Examination of Anodic Silver Oxide Films by EXAFS in the Reflection Mode.

ChemInform ◽  
2010 ◽  
Vol 26 (23) ◽  
pp. no-no
Author(s):  
D. HECHT ◽  
P. BORTHEN ◽  
H.-H. STREHBLOW
Keyword(s):  
Silver Oxide ◽  
Oxide Films ◽  
Reflection Mode ◽  
In Situ Examination

Enhancing oxidation resistance of Cu during repeated melting by the in-situ formation of protective oxide films

2021 ◽  
Vol 286 ◽  
pp. 129234
Author(s):  
Yongli Guo ◽  
Hui Cai ◽  
Zhe Wang ◽  
Xin Wang ◽  
Peng Cao ◽  
...  
Keyword(s):  
Oxidation Resistance ◽  
Oxide Films ◽  
Protective Oxide ◽  
In Situ Formation

Incorporation and Role of Nitrogen During Oxynitridation of Silicon Studied by Photoelectron Spectroscopy

1999 ◽  
Vol 567 ◽  
Author(s):  
Masayuki Suzuki ◽  
Yoji Saito
Keyword(s):  
Photoelectron Spectroscopy ◽  
High Vacuum ◽  
Oxide Films ◽  
Silicon Surfaces ◽  
Gaseous Mixtures ◽  
X Ray ◽  
Initial Stage ◽  
Thermal Stability Of

ABSTRACTWe tried direct oxynitridation of silicon surfaces by remote-plasma-exited nitrogen and oxygen gaseous mixtures at 700°C in a high vacuum. The oxynitrided surfaces were investigated with in-situ X-ray photoelectron spectroscopy. With increase of the oxynitridation time, the surface density of nitrogen gradually increases, but that of oxygen shows nearly saturation behavior after the rapid increase in the initial stage. We also annealed the grown oxynitride and oxide films to investigate the role of the contained nitrogen. The desorption rate of oxygen from the oxynitride films is much less than that from oxide films. We confirmed that nitrogen stabilizes the thermal stability of these oxynitride films.

scholarly journals An In Situ Reflection Mode Quick Scanning EXAFS Study of Anodic Oxide Layer Formation on Silver

1997 ◽  
Vol 7 (C2) ◽  
pp. C2-717-C2-722 ◽  
Author(s):  
D. Hecht ◽  
P. Borthen ◽  
R. Frahm ◽  
H.-H. Strehblow
Keyword(s):  
Oxide Layer ◽  
Anodic Oxide ◽  
Layer Formation ◽  
Reflection Mode ◽  
Exafs Study ◽  
Anodic Oxide Layer

scholarly journals Development of "In-situ" Observation System for Oxide Films Formed during Thermal Oxidation Using Raman Spectroscopy

1995 ◽  
Vol 81 (6) ◽  
pp. 607-612 ◽  
Author(s):  
Takayuki NARUSHIMA ◽  
Naoki KIKUCHI ◽  
Makoto MARUYAMA ◽  
Haruo ARASHI ◽  
Yuichiro NISHINA ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Thermal Oxidation ◽  
Oxide Films ◽  
Observation System ◽  
In Situ Observation
Sign in / Sign up

Export Citation Format

Share Document