The role of redox chemistry in scanning tunneling microscopy imaging of electroactive films

1995 ◽  
Vol 394 (1-2) ◽  
pp. 177-185 ◽  
Author(s):  
Shelly R. Snyder ◽  
Henry S. White
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Redox Chemistry ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Microscopy Imaging ◽  
Electroactive Films

Scanning Tunneling Microscopy Imaging of Defects in Layered Compounds

1990 ◽  
Vol 209 ◽  
Author(s):  
G. P. E. M. Van Bakell ◽  
J. Th. M. De Hosson ◽  
T. Hibma
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Structural Features ◽  
Layered Compounds ◽  
Scanning Tunneling ◽  
X Ray Diffraction ◽  
Tunneling Microscopy ◽  
Microscopy Imaging ◽  
X Ray ◽  
Sample Orientation ◽  
Stm Images

ABSTRACTStructural features of TiS2 were studied by scanning tunneling microscopy (STM) and single-crystal X-ray diffraction was applied as a complementary technique. STM images in air and at room temperature revealed, beside the trigonal symmetry of the lattice, several new features having this symmetry as well. We conclude that these features not only are to be described by structural defect phenomena which affect octahedral sites in the 1T-CdI2 structure but tetrahedral sites as well. Sample orientation determination by X-ray diffraction provides a unique relation between feature types and sites. A model is proposed in which displaced Ti atoms account for the observed features.

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