Combined atomic force microscopy and scanning tunneling microscopy imaging of cross-sectioned GaN light-emitting diodes
2010 ◽
Vol 28
(3)
◽
pp. C4E12-C4E20
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1994 ◽
pp. 229-236
1993 ◽
Vol 32
(Part 1, No. 12B)
◽
pp. 6200-9202
◽
1997 ◽
Vol 12
(8)
◽
pp. 1942-1945
◽
2019 ◽
Vol 40
(2)
◽
pp. 025004
◽