Standardized film thickness measurement technique

1986 ◽  
Vol 26 (6) ◽  
pp. 1197
Keyword(s):  
Film Thickness ◽  
Measurement Technique ◽  
Thickness Measurement ◽  
Film Thickness Measurement

Some Observations of the Relationship Between Film Thickness and Load in High Hertz Pressure Sliding Elastohydrodynamic Contacts

1973 ◽  
Vol 95 (3) ◽  
pp. 386-390 ◽  
Author(s):  
D. Lee ◽  
D. M. Sanborn ◽  
W. O. Winer
Keyword(s):  
Film Thickness ◽  
Measurement Technique ◽  
Thickness Measurement ◽  
Independent Study ◽  
Center Line ◽  
X Ray ◽  
Transmission Technique ◽  
Minimum Film Thickness ◽  
Film Thickness Measurement ◽  
The Relationship

The dependence of film thickness on Hertz pressure at pressure levels typical of design applications has been investigated. The data presented by investigators at NASA and Battelle using an X-ray transmission technique showing a dependence much greater than that indicated by commonly accepted theories are substantiated by an independent study using an optical interference film thickness measurement technique. It is also shown that the minimum film thickness is influenced to a much greater extent by the Hertz pressure than the center line film thickness.

Nanoscale film thickness measurement based on weak measurement

2020 ◽  
Vol 91 (12) ◽  
pp. 123111
Author(s):  
Zirui Qin ◽  
Qinggang Liu ◽  
Chong Yue ◽  
Yaopu Lang ◽  
Xinglin Zhou
Keyword(s):  
Film Thickness ◽  
Thickness Measurement ◽  
Weak Measurement ◽  
Film Thickness Measurement
Sign in / Sign up

Export Citation Format

Share Document