A new source-preparation technique for positron lifetime measurements in liquids

1977 ◽  
Vol 141 (3) ◽  
pp. 401-403 ◽  
Author(s):  
I. Dézsi ◽  
Zs. Kajcsos ◽  
B. Molnár
Keyword(s):  
Positron Lifetime ◽  
Preparation Technique ◽  
Lifetime Measurements ◽  
Source Preparation

Thermal vacancies and positron-lifetime measurements inFe76.3Al23.7

1990 ◽  
Vol 41 (17) ◽  
pp. 11869-11874 ◽  
Author(s):  
H.-E. Schaefer ◽  
R. Würschum ◽  
M. Sǒb ◽  
T. Zák ◽  
W. Z. Yu ◽  
...  
Keyword(s):  
Positron Lifetime ◽  
Lifetime Measurements

Positron Lifetime Measurements of Delta Doped MBE Grown Silicon Structures

1994 ◽  
Vol 175-178 ◽  
pp. 213-216
Author(s):  
J. Störmer ◽  
P. Willutzki ◽  
D.T. Britton ◽  
Werner Triftshäuser ◽  
W. Kiunke ◽  
...  
Keyword(s):  
Positron Lifetime ◽  
Lifetime Measurements ◽  
Silicon Structures

Positron lifetime measurements inn- andp-type silicon

1974 ◽  
Vol 4 (3) ◽  
pp. 271-272 ◽  
Author(s):  
M. Dorikens ◽  
C. Dauwe ◽  
L. Dorikens-Vanpraet
Keyword(s):  
Positron Lifetime ◽  
Lifetime Measurements ◽  
Type Silicon

Positron state and Lifetime in C60/C70 Fullerites

1992 ◽  
Vol 270 ◽  
Author(s):  
H.-E. Schaefer ◽  
M. Forster ◽  
R. WÜrschum ◽  
F. Banhart
Keyword(s):  
Electron Microscopy ◽  
Hydrostatic Pressure ◽  
High Resolution ◽  
Positron Annihilation ◽  
Positron Lifetime ◽  
High Resolution Electron Microscopy ◽  
Lattice Defects ◽  
Lifetime Measurements ◽  
Resolution Electron ◽  
Positron State

ABSTRACTThe present paper reports on positron lifetime measurements on Ceo/C 70 fullerite powder as a function of temperature and quasi-hydrostatic pressure in order to give an estimate of the positron annihilation site in the fullerite lattice. A single-component positron lifetime of 402 ps is observed which significantly decreases under quasi-hydrostatic pressure. From this and the soft intermolecular properties of the fullerites one can conclude that the positron is annihilated rather in the intermolecular space than inside the fullerene molecules. However, positron trapping at lattice defects, which are observed by high-resolution electron microscopy, cannot be ruled out.

Positron-lifetime measurements between 300 and 800 K in GaAs and GaP

1994 ◽  
Vol 50 (19) ◽  
pp. 14096-14103 ◽  
Author(s):  
S. Dannefaer ◽  
D. Kerr
Keyword(s):  
Positron Lifetime ◽  
Lifetime Measurements
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