Determination of fine structure intervals in a series of excited sodium D states using doppler free two-photon spectroscopy

1976 ◽  
Vol 18 (3) ◽  
pp. 377-380 ◽  
Author(s):  
Michael M. Salour
Keyword(s):  
Author(s):  
Vinayak P. Dravid ◽  
M.R. Notis ◽  
C.E. Lyman

The concept of interfacial width is often invoked in many materials science phenomena which relate to the structure and properties of internal interfaces. The numerical value of interface width is an important input parameter in diffusion equations, sintering theories as well as in many electronic devices/processes. Most often, however, this value is guessed rather than determined or even estimated. In this paper we present a method of determining the effective structural and electronic- structural width of interphase interfaces using low- and core loss fine structure effects in EELS spectra.The specimens used in the study were directionally solidified eutectics (DSEs) in the system; NiO-ZrO2(CaO), NiO-Y2O3 and MnO-ZrO2(ss). EELS experiments were carried out using a VG HB-501 FE STEM and a Hitachi HF-2000 FE TEM.


1979 ◽  
Vol 40 (12) ◽  
pp. 1139-1144 ◽  
Author(s):  
E. Giacobino ◽  
F. Biraben ◽  
E. de Clercq ◽  
K. Wohrer-Beroff ◽  
G. Grynberg

2021 ◽  
Vol 154 (5) ◽  
pp. 054308
Author(s):  
Do Won Kang ◽  
Sung Man Park ◽  
Chung Bin Park ◽  
Bong June Sung ◽  
Hong Lae Kim ◽  
...  

2005 ◽  
Vol 21 (7) ◽  
pp. 769-773 ◽  
Author(s):  
Masaki TAKAOKA ◽  
Satoshi FUKUTANI ◽  
Takashi YAMAMOTO ◽  
Masato HORIUCHI ◽  
Naoya SATTA ◽  
...  

1993 ◽  
Vol 102 (5-6) ◽  
pp. 432-438 ◽  
Author(s):  
F. Nez ◽  
F. Biraben ◽  
R. Felder ◽  
Y. Millerioux

1995 ◽  
Vol 20 (23) ◽  
pp. 2372 ◽  
Author(s):  
Chris Xu ◽  
Winfried Denk ◽  
Jeffrey Guild ◽  
Watt W. Webb

The Analyst ◽  
2011 ◽  
Vol 136 (10) ◽  
pp. 2139 ◽  
Author(s):  
Lingzhi Liu ◽  
Xiaohu Dong ◽  
Yan Xiao ◽  
Wenlong Lian ◽  
Zhihong Liu

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