Characterization of polypyrrole-fibre composites by time-of-flight secondary ion mass spectrometry and vibrational spectroscopy

Time Of Flight ◽

Fibre Composites ◽

Ion Mass Spectrometry ◽

Detection of Au+ Ions During Fluorine Gas-Assisted Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) for the Complete Elemental Characterization of Microbatteries

ACS Applied Materials & Interfaces ◽

10.1021/acsami.1c10352 ◽

2021 ◽

Vol 13 (34) ◽

pp. 41262-41274

Author(s):

Agnieszka Priebe ◽

Jordi Sastre ◽

Moritz H. Futscher ◽

Jakub Jurczyk ◽

Marcos V. Puydinger dos Santos ◽

...

Keyword(s):

Mass Spectrometry ◽

Time Of Flight ◽

Tof Sims ◽

Ion Mass Spectrometry ◽

Secondary Ion ◽

Elemental Characterization

Forensic Characterization of Lipsticks Using Time-of-Flight Secondary Ion Mass Spectrometry

Journal of Analytical Chemistry ◽

10.1134/s1061934821070091 ◽

2021 ◽

Vol 76 (7) ◽

pp. 854-867

Author(s):

Jihye Lee ◽

Yeonhee Lee

Keyword(s):

Mass Spectrometry ◽

Time Of Flight ◽

Ion Mass Spectrometry ◽

Characterization of sequentially grafted polysaccharide coatings using time-of-flight secondary ion mass spectrometry (ToF-SIMS) and principal component analysis (PCA)

Surface and Interface Analysis ◽

10.1002/sia.1446 ◽

2002 ◽

Vol 33 (12) ◽

pp. 924-931 ◽

Cited By ~ 13

Author(s):

Sally L. McArthur ◽

Matthew S. Wagner ◽

Patrick G. Hartley ◽

Keith M. McLean ◽

Hans J. Griesser ◽

...

Keyword(s):

Mass Spectrometry ◽

Principal Component Analysis ◽

Time Of Flight ◽

Principal Component ◽

Component Analysis ◽

Tof Sims ◽

Ion Mass Spectrometry ◽

Interfacial Characterization of Dentin Conditioned with Chitosan Hydroxyapatite Precursor Nanocomplexes Using Time-of-flight Secondary Ion Mass Spectrometry

Journal of Endodontics ◽

10.1016/j.joen.2019.08.011 ◽

2019 ◽

Vol 45 (12) ◽

pp. 1513-1521 ◽

Cited By ~ 2

Author(s):

Anam Hashmi ◽

Rana N.S. Sodhi ◽

Anil Kishen

Keyword(s):

Mass Spectrometry ◽

Time Of Flight ◽

Ion Mass Spectrometry ◽

Characterization of gunpowder samples using time-of-flight secondary ion mass spectrometry (TOF-SIMS)

Forensic Science International ◽

10.1016/j.forsciint.2005.02.036 ◽

2006 ◽

Vol 158 (1) ◽

pp. 39-51 ◽

Cited By ~ 48

Author(s):

Christine M. Mahoney ◽

Greg Gillen ◽

Albert J. Fahey

Keyword(s):

Mass Spectrometry ◽

Time Of Flight ◽

Tof Sims ◽

Ion Mass Spectrometry ◽

Quantitative time-of-flight secondary ion mass spectrometry for the characterization of multicomponent adsorbed protein films

Applied Surface Science ◽

10.1016/s0169-4332(02)00795-x ◽

2003 ◽

Vol 203-204 ◽

pp. 704-709 ◽

Cited By ~ 17

Author(s):

M.S. Wagner ◽

M. Shen ◽

T.A. Horbett ◽

David G. Castner

Keyword(s):

Mass Spectrometry ◽

Time Of Flight ◽

Protein Films ◽

Adsorbed Protein ◽

Ion Mass Spectrometry ◽

Static time-of-flight secondary ion mass spectrometry and x-ray photoelectron spectroscopy characterization of adsorbed albumin and fibronectin films

Surface and Interface Analysis ◽

10.1002/sia.1101 ◽

2001 ◽

Vol 31 (8) ◽

pp. 724-733 ◽

Cited By ~ 94

Author(s):

Caren D. Tidwell ◽

David G. Castner ◽

Stephen L. Golledge ◽

Buddy D. Ratner ◽

Klaus Meyer ◽

...

Keyword(s):

Mass Spectrometry ◽

Photoelectron Spectroscopy ◽

Time Of Flight ◽

X Ray ◽

Ion Mass Spectrometry ◽

Characterization of a Lubricant Film in a Wearing Region on a Thin-Film Magnetic Recording Disk by Time-of-Flight Secondary Ion Mass Spectrometry.

Journal of the Magnetics Society of Japan ◽

10.3379/jmsjmag.19.56 ◽

1995 ◽

Vol 19 (1) ◽

pp. 56-60 ◽

Cited By ~ 1

Author(s):

T. Amemiya ◽

N. Yoshino ◽

Y. Umeda ◽

Y. Nihei

Keyword(s):

Thin Film ◽

Mass Spectrometry ◽

Magnetic Recording ◽

Time Of Flight ◽

Lubricant Film ◽

Ion Mass Spectrometry ◽

THE APPLICATION OF TIME-OF-FLIGHT SECONDARY ION MASS SPECTROMETRY (ToF-SIMS) TO THE CHARACTERIZATION OF OPAQUE ANCIENT GLASSES

Archaeometry ◽

10.1111/j.1475-4754.2009.00445.x ◽

2009 ◽

Author(s):

F. J. M. RUTTEN ◽

D. BRIGGS ◽

J. HENDERSON ◽

M. J. ROE

Keyword(s):

Mass Spectrometry ◽

Time Of Flight ◽

Tof Sims ◽

Ion Mass Spectrometry ◽

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) for high-throughput characterization of biosurfaces

Applied Surface Science ◽

10.1016/s0169-4332(02)00822-x ◽

2003 ◽

Vol 203-204 ◽

pp. 855-858 ◽

Cited By ~ 12

Author(s):

S. Roberson ◽

A. Sehgal ◽

A. Fahey ◽

A. Karim

Keyword(s):

Mass Spectrometry ◽

High Throughput ◽

Time Of Flight ◽

Tof Sims ◽

Ion Mass Spectrometry ◽