Detection of Au+ Ions During Fluorine Gas-Assisted Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) for the Complete Elemental Characterization of Microbatteries

2021 ◽  
Vol 13 (34) ◽  
pp. 41262-41274
Author(s):  
Agnieszka Priebe ◽  
Jordi Sastre ◽  
Moritz H. Futscher ◽  
Jakub Jurczyk ◽  
Marcos V. Puydinger dos Santos ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
Tof Sims ◽  
Ion Mass Spectrometry ◽  
Secondary Ion ◽  
Elemental Characterization

Characterization of hydrogenated graphite powder by X-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry

RSC Advances ◽  
2016 ◽  
Vol 6 (84) ◽  
pp. 80649-80654 ◽  
Author(s):  
Wenjing Xie ◽  
Kai Mo Ng ◽  
Lu-Tao Weng ◽  
Chi-Ming Chan
Keyword(s):  
Mass Spectrometry ◽  
Photoelectron Spectroscopy ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
Graphite Powder ◽  
X Ray ◽  
Tof Sims ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Hydrogenated graphite powder was obtained through Birch reduction of graphite powder and characterized by X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary ion mass spectrometry (ToF-SIMS) at 500 °C.

Characterization of hydroxyapatite deposition on biomimetic polyphosphazenes by time-of-flight secondary ion mass spectrometry (ToF-SIMS)

RSC Advances ◽  
2014 ◽  
Vol 4 (38) ◽  
pp. 19680-19689 ◽  
Author(s):  
Nicole L. Morozowich ◽  
Jordan O. Lerach ◽  
Tomasz Modzelewski ◽  
Lauren Jackson ◽  
Nicholas Winograd ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
Tof Sims ◽  
Ion Mass Spectrometry ◽  
Secondary Ion
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