Short range order of amorphous Sb2S3 thin films: An x-ray diffraction study

Amorphous Co25Ti75 could be produced using the melt-spin-technique. A neutron- and a X-ray-diffraction experiment was performed. Assuming SNC ≡ 0 the partial Bhatia Thornton structure factors SNN and SCC as well as the partial coordination numbers were calculated. The discussion yields the atomic distances and the chemical short range order parameters.

Download Full-text

X-ray diffraction study of the effect of hydrogen atoms on the Si–Si atomic short-range order in amorphous silicon

phys stat sol (a) ◽

10.1002/pssa.2210520215 ◽

1979 ◽

Vol 52 (2) ◽

pp. 475-479 ◽

Cited By ~ 42

Author(s):

R. Mosseri ◽

C. Sella ◽

J. Dixmier

Keyword(s):

Diffraction Study ◽

Amorphous Silicon ◽

Short Range ◽

Short Range Order ◽

Range Order ◽

X Ray Diffraction ◽

Hydrogen Atoms ◽

X Ray

Download Full-text

X-ray Diffraction Study of Short-range Order and Long-range Ordered Structure in Cu–87.5 at.% Pt Alloy

Journal of the Physical Society of Japan ◽

10.1143/jpsj.72.1670 ◽

2003 ◽

Vol 72 (7) ◽

pp. 1670-1674 ◽

Cited By ~ 5

Author(s):

Dilip Kumar Saha ◽

Toetsu Shishido ◽

Hiroshi Iwasaki ◽

Ken-ichi Ohshima

Keyword(s):

Diffraction Study ◽

Long Range ◽

Short Range ◽

Short Range Order ◽

Range Order ◽

Ordered Structure ◽

X Ray Diffraction ◽

X Ray ◽

Pt Alloy

Download Full-text

In vacuo X-ray diffraction study of atomic short-range order in inert-gas-condensed Fe

Nanostructured Materials ◽

10.1016/0965-9773(95)00128-x ◽

1995 ◽

Vol 6 (5-8) ◽

pp. 593-596 ◽

Cited By ~ 17

Author(s):

N. Schlorke ◽

J. Weissmüller ◽

W. Dickenscheid ◽

H. Gleiter

Keyword(s):

Diffraction Study ◽

Short Range ◽

Short Range Order ◽

Range Order ◽

Inert Gas ◽

X Ray Diffraction ◽

X Ray

Download Full-text

Röntgen-Beugungsuntersuchungen an geschmolzenem Tellur / X-ray Diffraction Study of Molten Tellurium

Zeitschrift für Naturforschung A ◽

10.1515/zna-1975-0218 ◽

1975 ◽

Vol 30 (2) ◽

pp. 235-241 ◽

Cited By ~ 10

Author(s):

W. Hoyer ◽

E. Thomas ◽

M. Wobst

Keyword(s):

Diffraction Study ◽

Short Range ◽

Short Range Order ◽

Chain Structure ◽

Range Order ◽

X Ray Diffraction ◽

Free Surfaces ◽

X Ray ◽

Nearest Neighbours ◽

A Chain

Abstract X-ray Diffraction Study of Molten Tellurium An X-ray diffraction apparatus with focusing geometry used for the investigation of free surfaces of melts and a computer programme for the analysis of scattering intensities are discribed. The results of our measurements on molten tellurium at 480, 550 and 620 °C are presented and compared with a model of the temperature change of the short range order in molten tellurium as described by Cabane, Tourand and Breuil 14-17. The important result is that the number of nearest neighbours is approximately 3 at all the 3 temperatures. This suggests that the short range order is changing at the melting point from a chain structure to an antimony-like structure.

Download Full-text