Analysis of the outermost atomic layer of a surface by low-energy ion scattering

1973 ◽  
Vol 35 ◽  
pp. 393-412 ◽  
Author(s):  
H.H. Brongersmal ◽  
P.M. Mu
Keyword(s):  
Atomic Layer ◽  
Low Energy ◽  
Ion Scattering ◽  
Low Energy Ion Scattering

LOW ENERGY ION SCATTERING

2007 ◽  
Vol 14 (01) ◽  
pp. 31-41 ◽  
Author(s):  
FERIDOUN SAMAVAT ◽  
BRUCE V. KING ◽  
D. JOHN O'CONNOR
Keyword(s):  
Surface Analysis ◽  
Atomic Layer ◽  
Low Energy ◽  
Surface Atom ◽  
Ion Scattering ◽  
Low Energy Ion Scattering ◽  
Composition And Structure ◽  
Extreme Sensitivity ◽  
Low Energy Ions

Low energy ion scattering (LEIS) is the study of the composition and structure of a surface by the detection of low energy ions with energies ranging from 100 eV to 10 keV elastically scattered off the surface. The extreme sensitivity to the outermost atomic layer makes it as a unique tool for surface analysis. In this paper, concepts of shadowing, blocking, and also polar and azimuthal scans have been described. Surface order and surface atom spacings are revealed by using these concepts and measuring the intensity of backscattered projectiles as a function of the incident and azimuthal angles.

Surface Microanalysis by Low-Energy Ion Scattering

2011 ◽  
Vol 19 (2) ◽  
pp. 34-38 ◽  
Author(s):  
T. Grehl ◽  
E. Niehuis ◽  
H. H. Brongersma
Keyword(s):  
High Sensitivity ◽  
Atomic Layer ◽  
Low Energy ◽  
High Mass ◽  
Ion Scattering ◽  
Ion Energy ◽  
Low Energy Ion Scattering ◽  
High Mass Resolution ◽  
Recent Developments ◽  
Non Destructive

Low-energy ion scattering (LEIS) has gained new capabilities and now provides high-end instrumentation for real-world surface analytical applications. Although the technique has been available for some decades, recent developments in instrumentation make the unique capabilities of LEIS accessible for everyday applications. Special ion energy analyzer designs allow LEIS to be used for non-destructive quantitative analysis of the elemental composition of the outermost atomic layer with high sensitivity and high mass resolution. At the same time, the composition of the first 10 nm of sub-surface material is also assessed. Applications are very broad, ranging from catalysts to various thin films to polymers.

Sulfidation of W(001) studied by low-energy ion scattering

1994 ◽  
Vol 317 (3) ◽  
pp. 341-352 ◽  
Author(s):  
S.H. Overbury ◽  
R.J.A. van den Oetelaar ◽  
D.R. Mullins
Keyword(s):  
Low Energy ◽  
Ion Scattering ◽  
Low Energy Ion Scattering

Investigation of low-energy ion scattering as a surface analytical technique

1972 ◽  
Vol 30 (1) ◽  
pp. 69-90 ◽  
Author(s):  
D.J. Ball ◽  
T.M. Buck ◽  
D. Macnair ◽  
G.H. Wheatley
Keyword(s):  
Low Energy ◽  
Ion Scattering ◽  
Analytical Technique ◽  
Low Energy Ion Scattering ◽  
Surface Analytical Technique

Low-Energy Ion Scattering Measurements from an Al-Pd-Mn Quasicrystal

2000 ◽  
Vol 643 ◽  
Author(s):  
R. Bastasz ◽  
C. J. Jenks ◽  
T. A. Lograsso ◽  
A. R. Ross ◽  
P. A. Thiel ◽  
...  
Keyword(s):  
Signal Intensity ◽  
Surface Composition ◽  
Incidence Angle ◽  
Local Environment ◽  
Forward Direction ◽  
Low Energy ◽  
Angle Of Incidence ◽  
Fold Axis ◽  
Ion Scattering ◽  
Low Energy Ion Scattering

AbstractEnergy-angle distributions of low-energy inert-gas ions scattered from surfaces provide information about surface composition and structure. We have measured energy spectra of He+ scattered from an Al71Pd20Mn9 quasicrystal, which was oriented perpendicular to the 5-fold axis, along various azimuthal directions. Strong scattering signals are seen from Al and Pd, but only a weak Mn signal is observed. From measurements made of He+ at an oblique angle of incidence scattered in the forward direction, we observe a 72° periodicity in the azimuthal dependence of the scattering signal intensity from Al surface atoms. The effect arises from shadowing effects involving neighboring surface atoms and provides direct evidence that Al surface atoms exist in a local environment with 5-fold symmetry. In addition, measuring the variation of the signal intensity with incidence angle provides information about neighboring atom distances, which compare favorably with a model of the quasicrystal surface derived from the bulk structure.

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