Exact and approximate equations for the thickness dependence of resistivity and its temperature coefficient in thin polycrystalline metal films

1973 ◽  
Vol 18 (1) ◽  
pp. 137-144 ◽  
Author(s):  
E.E. Mola ◽  
J.M. Heras
Keyword(s):  
Temperature Coefficient ◽  
Metal Films ◽  
Thickness Dependence ◽  
Polycrystalline Metal ◽  
Thin Polycrystalline ◽  
Approximate Equations

scholarly journals Three Dimensional Analytical Separation of Grain Boundary and Surface Scatterings in Polycrystalline Metal Films in the Case of Non Cubic Grains

1981 ◽  
Vol 9 (2) ◽  
pp. 125-130 ◽  
Author(s):  
C. R. Tellier ◽  
C. R. Pichard ◽  
A. J. Tosser
Keyword(s):  
Grain Boundaries ◽  
Three Dimensional ◽  
Approximate Model ◽  
Metal Films ◽  
Three Dimensional Model ◽  
Polycrystalline Metal ◽  
Fine Grained ◽  
Thin Polycrystalline ◽  
Analytical Separation ◽  
Approximate Expressions

Analytical approximate expressions for the resistivity and its temperature coefficient of thin polycrystalline metal films have been derived by considering separately the contributions of the grain-boundaries perpendicular to thex-,y- andz-axes. Provided that the grain-boundaries act as moderately efficient scatterers reasonable deviations from the three-dimensional model are obtained; an approximate model then seems convenient with which to perform the calculations of the strain coefficients of such fine-grained films.

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