Grain-size dependence of temperature coefficient of resistance of polycrystalline metal films

1973 ◽  
Vol 61 (11) ◽  
pp. 1653-1654 ◽  
Author(s):  
A. Singh
1975 ◽  
Vol 46 (6) ◽  
pp. 2658-2661 ◽  
Author(s):  
L. L. Kazmerski ◽  
Diane M. Racine ◽  
M. S. Ayyagari

2013 ◽  
Vol 787 ◽  
pp. 88-93
Author(s):  
Guo Shou Zou ◽  
Hong Qiu ◽  
Bing Hu

80nm-thick network Ni films were sputter-deposited on anodic aluminium oxide (AAO) substrates at 300 K and 573 K. The network films are formed by granule connection. The granule consists of many fine grains. Both granule size and grain size are independent of the deposition temperature. A temperature dependence of the resistance within 1.6-300 K reveals that the network Ni film grown at 300 K exhibits a minimal resistance at about 25 K while that grown at 573 K does not show a minimal resistance. A temperature coefficient of resistance of the network film grown at 573 K is larger than that of the film grown at 300 K.


2020 ◽  
Vol 2020 (10) ◽  
Author(s):  
I.I. Pyataikin ◽  

The influence of size effect on the coefficients characterizing reflection, transmission, and absorption of microwaves by polycrystalline metal films is studied. Using the example of gold films, the article examines the influence of internal size effect due to their polycrystalline structure on the value of the parameter that determines the dependence of the , and coefficients on the film thickness. It was found that, depending on the value of the reflection coefficient of electrons striking the grain boundaries, parameter calculated using the Mayadas-Shatzkes-Janak (MSJ) theory for grain size effect differs significantly from that obtained in calculations based on the use of the Fuchs-Sondheimer theory for thickness size effect. The dependence of on the parameters determining the grain growth rate and limiting grain size has been established, which made it possible to reveal the effect of the film microstructure on the dependence of the , and coefficients on the film thickness. Based on the revealed character of the dependence of on the parameters of the MSJ theory and the structural parameters of the film, recommendations are proposed for choosing the metals that are most optimal for producing coatings for electromagnetic interference shielding.


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