Three Dimensional Analytical Separation of Grain Boundary and Surface Scatterings in Polycrystalline Metal Films in the Case of Non Cubic Grains
1981 ◽
Vol 9
(2)
◽
pp. 125-130
◽
Keyword(s):
Analytical approximate expressions for the resistivity and its temperature coefficient of thin polycrystalline metal films have been derived by considering separately the contributions of the grain-boundaries perpendicular to thex-,y- andz-axes. Provided that the grain-boundaries act as moderately efficient scatterers reasonable deviations from the three-dimensional model are obtained; an approximate model then seems convenient with which to perform the calculations of the strain coefficients of such fine-grained films.
1981 ◽
Vol 16
(8)
◽
pp. 2281-2286
◽
2000 ◽
Vol 39
(Part 2, No. 12B)
◽
pp. L1320-L1323
◽
1986 ◽
Vol 5
(10)
◽
pp. 1036-1038
◽
Keyword(s):
1990 ◽
Vol 56
(524)
◽
pp. 708-714
◽
Keyword(s):