Detection and characterization of transient surface periodic structures formed during pulsed-laser annealing of semiconductor surfaces by ellipsometry
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1999 ◽
Vol 60
(1)
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pp. 58-62
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1992 ◽
Vol 27
(7)
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pp. 959-964
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2001 ◽
Vol 328
(1-2)
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pp. 242-247
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1982 ◽
Vol 41
(4)
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pp. 321-324
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