Sputter induced near surface electronic defects in group II–IV compound semiconductor alloys

1987 ◽  
Vol 189-190 ◽  
pp. A432
Author(s):  
H. Neff ◽  
K.Y. Lay ◽  
M.S. Su ◽  
P. Lange ◽  
K.J. Bachmann
Keyword(s):  
Compound Semiconductor ◽  
Semiconductor Alloys ◽  
Near Surface ◽  
Group Ii ◽  
Electronic Defects

Sputter induced near surface electronic defects in group II–VI compound semiconductor alloys

1987 ◽  
Vol 189-190 ◽  
pp. 661-668 ◽  
Author(s):  
H. Neff ◽  
K.Y. Lay ◽  
M.S. Su ◽  
P. Lange ◽  
K.J. Bachmann
Keyword(s):  
Compound Semiconductor ◽  
Semiconductor Alloys ◽  
Near Surface ◽  
Group Ii ◽  
Electronic Defects

Optical characterization of compound semiconductor alloys

1974 ◽  
Vol 27 ◽  
pp. 166-176
Author(s):  
A. Onton ◽  
M.R. Lorenz ◽  
J.M. Woodall ◽  
R.J. Chicotka
Keyword(s):  
Optical Characterization ◽  
Compound Semiconductor ◽  
Semiconductor Alloys

Near-surface electronic defects and morphology of CuIn[sub 1−x]Ga[sub x]Se[sub 2]

2002 ◽  
Vol 20 (6) ◽  
pp. 2441 ◽  
Author(s):  
Y. M. Strzhemechny ◽  
P. E. Smith ◽  
S. T. Bradley ◽  
D. X. Liao ◽  
A. A. Rockett ◽  
...  
Keyword(s):  
Near Surface ◽  
Electronic Defects

scholarly journals Band anticrossing in highly mismatched group II-VI semiconductor alloys

2002 ◽  
Vol 31 (7) ◽  
pp. 754-758 ◽  
Author(s):  
K. M. Yu ◽  
J. Wu ◽  
W. Walukiewicz ◽  
J. W. Beeman ◽  
J. W. Ager ◽  
...  
Keyword(s):  
Semiconductor Alloys ◽  
Group Ii ◽  
Band Anticrossing

Incorporation kinetics in mixed anion compound semiconductor alloys

2013 ◽  
Vol 114 (23) ◽  
pp. 234907 ◽  
Author(s):  
Joanna M. Millunchick ◽  
Evan M. Anderson ◽  
Chris Pearson ◽  
Wendy L. Sarney ◽  
Stefan P. Svensson
Keyword(s):  
Compound Semiconductor ◽  
Semiconductor Alloys
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