Etching and annealing kinetics of heavy ion tracks in quartz crystal

1990 ◽  
Vol 46 (1-4) ◽  
pp. 149-151 ◽  
Author(s):  
Lakhwant Singh ◽  
A.S. Sandhu ◽  
Surinder Singh ◽  
H.S. Virk
Keyword(s):  
Quartz Crystal ◽  
Heavy Ion ◽  
Ion Tracks ◽  
Kinetics Of

Multi-scale Investigation of Heterogeneous Swift Heavy Ion Tracks in Stannate Pyrochlore

2021 ◽  
Author(s):  
Eric O'Quinn ◽  
Cameron Tracy ◽  
William F. Cureton ◽  
Ritesh Sachan ◽  
Joerg C. Neuefeind ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Heavy Ion ◽  
X Ray Diffraction ◽  
X Ray ◽  
Structural Modifications ◽  
Multi Scale ◽  
Ion Tracks ◽  
Swift Heavy Ion ◽  
Transmission Electron

Er2Sn2O7 pyrochlore was irradiated with swift heavy Au ions (2.2 GeV), and the induced structural modifications were systematically examined using complementary characterization techniques including transmission electron microscopy (TEM), X-ray diffraction...

Microdosimetric measurements of heavy ion tracks

1992 ◽  
Vol 12 (2-3) ◽  
pp. 23-32 ◽  
Author(s):  
L.A. Braby ◽  
N.F. Metting ◽  
W.E. Wilson ◽  
L.H. Toburen
Keyword(s):  
Heavy Ion ◽  
Ion Tracks

Oxygen Precipitation Along Individual Ion Tracks During High Dose O+ Implantation into Silicon

1987 ◽  
Vol 93 ◽  
Author(s):  
Witold P. Maszara
Keyword(s):  
Silicon Layer ◽  
High Dose ◽  
Regular Array ◽  
Ion Tracks ◽  
Oxygen Precipitation ◽  
Transmission Electron ◽  
Oxygen Gas ◽  
Kinetics Of ◽  
Secondary Ion ◽  
Lattice Matched

ABSTRACTSilicon wafers with and without protective1Ahermil oxide were implanted with oxygen at 150keV with doses 1.6 – 2.0×1018 cm−2. Transmission electron microscopy (TEM) and secondary ion mass spectroscopy (SIMS) were used to study the top silicon layer remaining above the implanted buried oxide. regular array of spheroidal voids filled with oxygen gas was observed only in the samples that were not protected by the oxide. The voids were aligned into individual columns whose crystallographic orientation with respect to the host silicon lattice matched the direction of the implantation. The origin and the kinetics of their formation are discussed.

Kinetics of Water Sorption in NafionThin Films − Quartz Crystal Microbalance Study

2001 ◽  
Vol 105 (33) ◽  
pp. 7979-7983 ◽  
Author(s):  
Petr Krtil ◽  
Antonín Trojánek ◽  
Zdeněk Samec
Keyword(s):  
Quartz Crystal Microbalance ◽  
Water Sorption ◽  
Quartz Crystal ◽  
Kinetics Of

Greater Radiation Chemical Yields for Losses of Ether and Carbonate Ester Bonds at Lower Stopping Powers along Heavy Ion Tracks in Poly(allyl diglycol carbonate) Films

2012 ◽  
Vol 5 (8) ◽  
pp. 086401 ◽  
Author(s):  
Yutaka Mori ◽  
Tomoya Yamauchi ◽  
Masato Kanasaki ◽  
Atsuto Hattori ◽  
Yuri Matai ◽  
...  
Keyword(s):  
Heavy Ion ◽  
Radiation Chemical ◽  
Ion Tracks
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