Experimental determination of the photon economy in polycrystalline thin film photovoltaic materials and devices

Solar Cells ◽

10.1016/0379-6787(80)90077-0 ◽

1980 ◽

Vol 1 (3) ◽

pp. 275-283

Author(s):

J.A. Bragagnolo ◽

E.A. Fagen

Keyword(s):

Thin Film ◽

Experimental Determination ◽

Polycrystalline Thin Film ◽

Photovoltaic Materials

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Experimental Determination of Effective Attenuation Length for SiO2 Thin Film with Synchrotron Radiation Photoemission Spectroscopy

IEEJ Transactions on Electronics Information and Systems ◽

10.1541/ieejeiss.130.1817 ◽

2010 ◽

Vol 130 (10) ◽

pp. 1817-1818

Author(s):

Keisuke Inoue ◽

Yuden Teraoka

Keyword(s):

Thin Film ◽

Synchrotron Radiation ◽

Experimental Determination ◽

Photoemission Spectroscopy ◽

Attenuation Length ◽

Sio2 Thin Film ◽

Synchrotron Radiation Photoemission

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Experimental determination of the electro-acoustic properties of thin film AlScN using surface acoustic wave resonators

Journal of Applied Physics ◽

10.1063/1.5094611 ◽

2019 ◽

Vol 126 (7) ◽

pp. 075106 ◽

Author(s):

Nicolas Kurz ◽

Anli Ding ◽

Daniel F. Urban ◽

Yuan Lu ◽

Lutz Kirste ◽

...

Keyword(s):

Thin Film ◽

Acoustic Wave ◽

Experimental Determination ◽

Surface Acoustic Wave ◽

Acoustic Properties ◽

Acoustic Wave Resonators

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Experimental Determination of Thin Film Optical Constants

Optical Coatings - Springer Series in Surface Sciences ◽

10.1007/978-3-642-54063-9_5 ◽

2014 ◽

pp. 117-158

Author(s):

Olaf Stenzel

Keyword(s):

Thin Film ◽

Experimental Determination ◽

Optical Constants

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Experimental determination of thin film adhesion using 4 point bending specimen

Advances in Electronic Materials and Packaging 2001 (Cat. No.01EX506) ◽

10.1109/emap.2001.984013 ◽

2002 ◽

Author(s):

J.H. Kim ◽

Sae Bom Lee ◽

Y.Y. Earmme

Keyword(s):

Thin Film ◽

Experimental Determination ◽

Film Adhesion ◽

Thin Film Adhesion

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Thin‐Film Technique for the Experimental Determination of the Elastic Strain on the Electron Mean Free Path and on the Free‐Electron Density in Bulk Metals

Journal of Applied Physics ◽

10.1063/1.1656887 ◽

1968 ◽

Vol 39 (8) ◽

pp. 3996-3998 ◽

Author(s):

Z. H. Meiksin

Keyword(s):

Thin Film ◽

Experimental Determination ◽

Free Path ◽

Free Electron ◽

Elastic Strain ◽

Mean Free Path ◽

Free Electron Density ◽

Thin Film Technique ◽

Electron Mean Free Path

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ISSUES CONCERNING THE DESIGN AND FABRICATION OF POLYCRYSTALLINE THIN-FILM Cu(In,Ga)Se2-BASED PHOTOVOLTAIC MATERIALS AND DEVICES

1991 Solar World Congress ◽

10.1016/b978-0-08-041696-0.50012-7 ◽

1992 ◽

pp. 21-26

Author(s):

John R. Tuttle ◽

David S. Albin ◽

Rommel Noufi

Keyword(s):

Thin Film ◽

Polycrystalline Thin Film ◽

Photovoltaic Materials

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Experimental determination of the distribution of relaxation time for thermally activated transition in thin film magnetic recording media

Journal of Applied Physics ◽

10.1063/1.370071 ◽

1999 ◽

Vol 85 (8) ◽

pp. 5000-5002 ◽

Author(s):

Cheng Yang ◽

John M. Sivertsen ◽

Tan Li ◽

Jack H. Judy

Keyword(s):

Thin Film ◽

Relaxation Time ◽

Experimental Determination ◽

Magnetic Recording ◽

Recording Media ◽

Magnetic Recording Media ◽

Thermally Activated

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Experimental determination of detectiòn limits and calibration constants for energy-dispersive x-ray analysis using thin film frozen hydrated solutions

Ultramicroscopy ◽

10.1016/s0304-3991(79)90283-3 ◽

1979 ◽

Vol 4 (2) ◽

pp. 233-239 ◽

Author(s):

Thomas E. Hutchinson ◽

James R. Borek

Keyword(s):

Thin Film ◽

Experimental Determination ◽

Detection Limits ◽

Energy Dispersive ◽

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Method of the Calculation and Experimental Determination of the Optimal Assembly of Electrospark Discharge Parameters when Trimming Thin-Film Resistors

Vestnik of Volga State University of Technology Ser Radio Engineering and Infocommunication Systems ◽

10.15350/2306-2819.2017.2.67 ◽

2017 ◽

Vol 34 (2) ◽

Author(s):

Vladimir Leuhin ◽

Evgeny Shabdarov

Keyword(s):

Thin Film ◽

Experimental Determination ◽

Thin Film Resistors ◽

Discharge Parameters ◽

Optimal Assembly

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Photoacoustic elastic bending in thin film–substrate system: Experimental determination of the thin film parameters

Journal of Applied Physics ◽

10.1063/1.4890346 ◽

2014 ◽

Vol 116 (5) ◽

pp. 053506 ◽

Author(s):

D. M. Todorović ◽

M. D. Rabasović ◽

D. D. Markushev ◽

M. Sarajlić

Keyword(s):

Thin Film ◽

Experimental Determination ◽

Elastic Bending ◽

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