Phase analysis of surface layers by Mössbauer spectroscopy

1984 ◽  
Vol 39 (12) ◽  
pp. 1505-1511 ◽  
Author(s):  
W. Meisel
2000 ◽  
Vol 31 (3) ◽  
pp. 793-798 ◽  
Author(s):  
Sei Jin Oh ◽  
Soon-Ju Kwon ◽  
Hongsug Oh ◽  
Sunghak Lee ◽  
Keun Chul Hwang

1996 ◽  
Vol 445 ◽  
Author(s):  
Robert C. Reno ◽  
Brett Piekarski

AbstractWe have used conversionelectron Mössbauer spectroscopy (CEMS) to examine the surfaces of solder foils treated in a plasma assisted dry soldering (PADS) system which has been developed1 to convert surface oxides to more desirable fluorides in order to protect the solder surface prior to assembly and to eliminate the need for flux during the soldering process. CEMS samples only the outer 1 μm of a solder foil and this, coupled with the fortuitous fact2 that Mössbauer spectroscopy is 10–20 times more sensitive to oxides and fluorides than to the metallic form of solder, means that surface layers of oxides and fluorides as thin as 10 nm can be detected and chemically identified. We have followed the evolution of surface layers produced in PADS treatments ranging from 7 minutes to several hours. Our results show that fully treated foils contain surface layers of SnF2 and Sn2F6. Partially treated foils also contain some SnO2 and perhaps a small amount of SnO. No Sn2OF2 or SnF4 was produced during any portion of the PADS treatment cycle.


1985 ◽  
Vol 15 (5) ◽  
pp. L129-L133 ◽  
Author(s):  
A Kostikas ◽  
V Papaefthymiou ◽  
A Simopoulos ◽  
G C Hadjipanayis

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